Inventor · disambiguated record

Kazufumi Sakai

Also filed as: SAKAI KAZUFUMI

2 granted patents·12 citations·filing 2009–2010

56Inventor score

Technology areasH10P

Files withSAKAI KAZUFUMI2

Top patents by PatentIndex Score

2 records

0175US9019498B2Method for inspecting defects, inspected wafer or semiconductor device manufactured using the same, method for quality control of wafers or semiconductor devices and defect inspecting apparatusSAKAI KAZUFUMI·Filed 2010·Granted Apr 28, 2015·5 cites·20 claims
0274US8599379B2Method for inspecting defects and defect inspecting apparatusSAKAI KAZUFUMI·Filed 2009·Granted Dec 3, 2013·7 cites·13 claims

Join the waitlist — get patent alerts

Get an alert when Kazufumi Sakai files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →