Inventor · disambiguated record
Joseph C. Werner
Also filed as: WERNER JOSEPH C
9 granted patents·1 pending application·36 citations·filing 2008–2022
81Inventor score
Top patents by PatentIndex Score
10 records- 0194US8197636B2Systems for plasma enhanced chemical vapor deposition and bevel edge etchingSHAH ASHISH·Filed 2008·Granted Jun 12, 2012·30 cites·11 claims
- 0287US11866821B2Substrate support cover for high-temperature corrosive environmentAPPLIED MATERIALS INC·Filed 2020·Granted Jan 9, 2024·2 cites·10 claims
- 0383US11094647B2Methods and apparatus to eliminate wafer bow for CVD and patterning HVM systemsAPPLIED MATERIALS INC·Filed 2019·Granted Aug 17, 2021·3 cites·20 claims
- 0481US11499231B2Lid stack for high frequency processingAPPLIED MATERIALS INC·Filed 2020·Granted Nov 15, 2022·1 cites·20 claims
- 0573US11846011B2Lid stack for high frequency processingAPPLIED MATERIALS INC·Filed 2022·Granted Dec 19, 2023·0 cites·15 claims
- 0658US11837448B2High-temperature chamber and chamber component cleaning and maintenance method and apparatusAPPLIED MATERIALS INC·Filed 2021·Granted Dec 5, 2023·0 cites·22 claims
- 0752US11215934B2In-situ light detection methods and apparatus for ultraviolet semiconductor substrate processingAPPLIED MATERIALS INC·Filed 2020·Granted Jan 4, 2022·0 cites·20 claims
- 0851US12013291B2Advanced temperature monitoring system with expandable modular layout designAPPLIED MATERIALS INC·Filed 2020·Granted Jun 18, 2024·0 cites·22 claims
- 0948US2012211164A1Systems for plasma enhanced chemical vapor deposition and bevel edge etchingSHAH ASHISH·Filed 2012·Application pending·0 cites
- 1041US12068180B2Advanced temperature monitoring system and methods for semiconductor manufacture productivityAPPLIED MATERIALS INC·Filed 2019·Granted Aug 20, 2024·0 cites·11 claims
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