Inventor · disambiguated record
Philip Measor
Also filed as: MEASOR PHILIP · MEASOR PHILIP S
7 granted patents·1 pending application·23 citations·filing 2009–2023
77Inventor score
Top patents by PatentIndex Score
8 records- 0188US11047806B2Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structuresKLA TENCOR CORP·Filed 2017·Granted Jun 29, 2021·8 cites·26 claims
- 0288US10887580B2Three-dimensional imaging for semiconductor wafer inspectionKLA TENCOR CORP·Filed 2017·Granted Jan 5, 2021·8 cites·27 claims
- 0370US7995890B2Device for light-based particle manipulation on waveguidesUNIV CALIFORNIA·Filed 2009·Granted Aug 9, 2011·7 cites·41 claims
- 0451US2023220501A1Pathogen detection systemWHITWORTH UNIV·Filed 2023·Application pending·0 cites
- 0546US10249546B2Reverse decoration for defect detection amplificationKLA TENCOR CORP·Filed 2016·Granted Apr 2, 2019·0 cites·5 claims
- 0644US10928740B2Three-dimensional calibration structures and methods for measuring buried defects on a three-dimensional semiconductor waferKLA TENCOR CORP·Filed 2017·Granted Feb 23, 2021·0 cites·30 claims
- 0742US11383429B23D printed optofluidic device and methods of fabricationWHITWORTH UNIV·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 0833US10018571B2System and method for dynamic care area generation on an inspection toolKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·0 cites·47 claims
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