Inventor · disambiguated record
Francis R. White
Also filed as: WHITE FRANCIS R · WHITE FRANCIS ROGER
26 granted patents·2 pending applications·1,374 citations·filing 1983–2011
97Inventor score
Top patents by PatentIndex Score
28 records- 0197US5270261AThree dimensional multichip package methods of fabricationIBM·Filed 1992·Granted Dec 14, 1993·332 cites·15 claims
- 0296US5202754AThree-dimensional multichip packages and methods of fabricationIBM·Filed 1991·Granted Apr 13, 1993·256 cites·6 claims
- 0395US5675185ASemiconductor structure incorporating thin film transistors with undoped cap oxide layersIBM·Filed 1995·Granted Oct 7, 1997·123 cites·24 claims
- 0495US5670803AThree-dimensional SRAM trench structure and fabrication method thereforIBM·Filed 1995·Granted Sep 23, 1997·140 cites·16 claims
- 0589US6022766ASemiconductor structure incorporating thin film transistors, and methods for its manufactureIBM·Filed 1997·Granted Feb 8, 2000·76 cites·2 claims
- 0688US5055898ADRAM memory cell having a horizontal SOI transfer device disposed over a buried storage node and fabrication methods thereforIBM·Filed 1991·Granted Oct 8, 1991·88 cites·28 claims
- 0786US8298906B2Trench decoupling capacitor formed by RIE lag of through silicon via (TSV) etchBERNSTEIN KERRY·Filed 2009·Granted Oct 30, 2012·14 cites·24 claims
- 0885US6038168AHot-electron programmable latch for integrated circuit fuse applications and method of programming thereforIBM·Filed 1998·Granted Mar 14, 2000·62 cites·15 claims
- 0981US4470189AProcess for making polycide structuresIBM·Filed 1983·Granted Sep 11, 1984·53 cites·18 claims
- 1080US4558508AProcess of making dual well CMOS semiconductor structure with aligned field-dopings using single masking stepIBM·Filed 1984·Granted Dec 17, 1985·48 cites·7 claims
- 1172US5096849AProcess for positioning a mask within a concave semiconductor structureIBM·Filed 1991·Granted Mar 17, 1992·50 cites·10 claims
- 1270US6548418B2Dual layer etch stop barrierIBM·Filed 2002·Granted Apr 15, 2003·10 cites·9 claims
- 1369US7989865B2Deep trench capacitor for SOI CMOS devices for soft error immunityIBM·Filed 2008·Granted Aug 2, 2011·3 cites·16 claims
- 1467US4799990AMethod of self-aligning a trench isolation structure to an implanted well regionIBM·Filed 1987·Granted Jan 24, 1989·32 cites·11 claims
- 1566US6174763B1Three-dimensional SRAM trench structure and fabrication method thereforIBM·Filed 1997·Granted Jan 16, 2001·21 cites·11 claims
- 1662US6680259B2Dual layer etch stop barrierIBM·Filed 2003·Granted Jan 20, 2004·6 cites·7 claims
- 1761US6140171AFET device containing a conducting sidewall spacer for local interconnect and method for its fabricationIBM·Filed 1999·Granted Oct 31, 2000·26 cites·25 claims
- 1859US7989893B2SOI body contact using E-DRAM technologyIBM·Filed 2008·Granted Aug 2, 2011·1 cites·7 claims
- 1957US6420777B2Dual layer etch stop barrierIBM·Filed 1998·Granted Jul 16, 2002·17 cites·8 claims
- 2056US7812388B2Deep trench capacitor and method of making sameIBM·Filed 2007·Granted Oct 12, 2010·1 cites·14 claims
- 2149US8133772B2Deep trench capacitor for SOI CMOS devices for soft error immunityBARTH JR JOHN E·Filed 2011·Granted Mar 13, 2012·0 cites·7 claims
- 2248US8053303B2SOI body contact using E-DRAM technologyIBM·Filed 2011·Granted Nov 8, 2011·0 cites·8 claims
- 2344US4527325AProcess for fabricating semiconductor devices utilizing a protective film during high temperature annealingIBM·Filed 1983·Granted Jul 9, 1985·14 cites·7 claims
- 2442US7694262B2Deep trench capacitor and method of making sameIBM·Filed 2007·Granted Apr 6, 2010·0 cites·11 claims
- 2540US6335272B1Buried butted contact and method for fabricatingIBM·Filed 2000·Granted Jan 1, 2002·0 cites·10 claims
- 2638US2005242439A1Method and structure for connecting ground/power networks to prevent charge damage in silicon on insulatorIBM·Filed 2004·Application pending·0 cites
- 2734US2003058675A1Silicon-on-insulator SRAM cells with increased stability and yieldIBM·Filed 2001·Application pending·0 cites
- 2831US6153934ABuried butted contact and method for fabricatingIBM·Filed 1998·Granted Nov 28, 2000·1 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →