Inventor · disambiguated record
Chia-Lin Chen
Also filed as: CHEN CHIA-LIN
35 granted patents·21 pending applications·468 citations·filing 2002–2025
97Inventor score
Files withTAIWAN SEMICONDUCTOR MFG34CHEN CHIA-LIN9VANGUARD INT SEMICONDUCT CORP3G FUN IND CORPORATION2ACADEMIA SINICA1
Top patents by PatentIndex Score
56 records- 0195US7268575B1Method of NBTI predictionTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Sep 11, 2007·41 cites·20 claims
- 0295US7052946B2Method for selectively stressing MOSFETs to improve charge carrier mobilityTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted May 30, 2006·84 cites·36 claims
- 0393US7259050B2Semiconductor device and method of making the sameTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Aug 21, 2007·75 cites·25 claims
- 0491US9563082B2Display panel and display device comprising the sameINNOLUX CORP·Filed 2015·Granted Feb 7, 2017·6 cites·12 claims
- 0590US6759302B1Method of generating multiple oxides by plasma nitridation on oxideTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jul 6, 2004·35 cites·10 claims
- 0689US7071066B2Method and structure for forming high-k gatesTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jul 4, 2006·46 cites·11 claims
- 0786US8106461B2Apparatus for NBTI predictionCHEN CHIA-LIN·Filed 2010·Granted Jan 31, 2012·6 cites·20 claims
- 0884US7118974B2Method of generating multiple oxides by plasma nitridation on oxideTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 10, 2006·22 cites·12 claims
- 0983US10793628B2Isolated antibodies against interleukin-17 receptor B (IL-17RB) for cancer therapyACADEMIA SINICA·Filed 2015·Granted Oct 6, 2020·3 cites·14 claims
- 1083US7820457B2Method of NBTI predictionTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Oct 26, 2010·10 cites·17 claims
- 1181US7579859B2Method for determining time dependent dielectric breakdownTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Aug 25, 2009·11 cites·25 claims
- 1281US6821868B2Method of forming nitrogen enriched gate dielectric with low effective oxide thicknessTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 23, 2004·33 cites·24 claims
- 1377US7696578B2Selective CESL structure for CMOS applicationTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Apr 13, 2010·10 cites·9 claims
- 1477US6737362B1Method for manufacturing a thin gate dielectric layer for integrated circuit fabricationTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted May 18, 2004·20 cites·17 claims
- 1574US7327009B2Selective nitride liner formation for shallow trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Feb 5, 2008·5 cites·4 claims
- 1671US7361572B2STI liner modification methodTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Apr 22, 2008·4 cites·15 claims
- 1771US7176138B2Selective nitride liner formation for shallow trench isolationTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 13, 2007·15 cites·21 claims
- 1871US7138317B2Method of generating multiple oxides by plasma nitridation on oxideTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Nov 21, 2006·9 cites·8 claims
- 1968US10683978B2Lamp power assembling structure and methodCHEN CHIA LIN·Filed 2018·Granted Jun 16, 2020·1 cites·7 claims
- 2064US6861339B2Method for fabricating laminated silicon gate electrodeTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 1, 2005·7 cites·14 claims
- 2163US2025311464A1Cmos image sensor with trench capacitor and method of manufacturing the samePOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2024·Application pending·0 cites
- 2263US2025215186A1Recycled plastic and preparation process and use thereofSINGTEX IND CO LTD·Filed 2024·Application pending·0 cites
- 2362US2019022835A1Socket with fastener holding and easilyremoving structureCHEN CHIA LIN·Filed 2018·Application pending·0 cites
- 2462US2025058286A1Moisture-permeable composite membrane and method for manufacturing the sameG FUN IND CORPORATION·Filed 2024·Application pending·0 cites
- 2561US6780741B2Method of forming a novel gate electrode structure comprised of a silicon-germanium layer located between random grained polysilicon layersTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Aug 24, 2004·9 cites·27 claims
- 2658USD960573STool boxCHEN CHIA LIN·Filed 2020·Granted Aug 16, 2022·2 cites·1 claims
- 2758US7012009B2Method for improving the electrical continuity for a silicon-germanium film across a silicon/oxide/polysilicon surface using a novel two-temperature processTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Mar 14, 2006·6 cites·23 claims
- 2857US2017190031A1Magnetic SocketCHEN CHIA-LIN·Filed 2016·Application pending·0 cites
- 2953US10996262B2Reliability determination methodVANGUARD INT SEMICONDUCT CORP·Filed 2019·Granted May 4, 2021·0 cites·12 claims
- 3053US6830996B2Device performance improvement by heavily doped pre-gate and post polysilicon gate cleanTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Dec 14, 2004·3 cites·19 claims
- 3152US8889507B2MIM capacitors with improved reliabilityWU CHIH-TA·Filed 2007·Granted Nov 18, 2014·1 cites·18 claims
- 3252US2008128835A1Semiconductor Device Having a Random Grained Polysilicon Layer and a Method for its ManufactureTAIWAN SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
- 3350US8115263B2Laminated silicon gate electrodeCHEN CHIA-LIN·Filed 2005·Granted Feb 14, 2012·0 cites·16 claims
- 3450US2008157266A1Sti liner modification methodTAIWAN SEMICONDUCTOR MFG·Filed 2008·Application pending·0 cites
- 3549US11847983B2Image display device and control method thereofQISDA CORP·Filed 2022·Granted Dec 19, 2023·0 cites·12 claims
- 3649US7453280B1Method for testing semiconductor devicesTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Nov 18, 2008·1 cites·15 claims
- 3749US6933157B2Semiconductor wafer manufacturing methods employing cleaning delay periodTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Aug 23, 2005·2 cites·14 claims
- 3848US2022341870A1Sensing electrodeMETAL IND RES & DEV CT·Filed 2021·Application pending·0 cites
- 3948US2008236218A1Steering Wheel Locking DeviceCHEN CHIA-LIN·Filed 2007·Application pending·0 cites
- 4047US7166525B2High temperature hydrogen annealing of a gate insulator layer to increase etching selectivity between conductive gate structure and gate insulator layerTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jan 23, 2007·1 cites·20 claims
- 4147US2006223255A1Method for selectively stressing MOSFETs to improve charge carrier mobilityTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
- 4247US2006183279A1Method for selectively stressing mosfets to improve charge carrier mobilityTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
- 4345US11955397B2Semiconductor structureVANGUARD INT SEMICONDUCT CORP·Filed 2020·Granted Apr 9, 2024·0 cites·17 claims
- 4445US2004214398A1Method of generating multiple oxides by plasma nitridation on oxideTAIWAN SEMICONDUCTOR MFG·Filed 2004·Application pending·0 cites
- 4545US2025283274A1Film-forming composition and film-coated fabric formed from the sameG FUN IND CORPORATION·Filed 2025·Application pending·0 cites
- 4644US7229919B2Semiconductor device having a random grained polysilicon layer and a method for its manufactureTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jun 12, 2007·0 cites·25 claims
- 4742US2020194459A1Semiconductor devices and methods for fabricating the sameVANGUARD INT SEMICONDUCT CORP·Filed 2018·Application pending·0 cites
- 4841US9406825B2Stacked and integrated electric power generating device capturing multiple light sources for power generationCHEN CHIA-LIN·Filed 2015·Granted Aug 2, 2016·0 cites·5 claims
- 4941US7316970B2Method for forming high selectivity protection layer on semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jan 8, 2008·0 cites·23 claims
- 5041US2006094194A1Advanced disposable spacer process by low-temperature high-stress nitride film for sub-90NM CMOS technologyTAIWAN SEMICONDUCTOR MFG·Filed 2004·Application pending·0 cites
Showing the top 50 of 56 patent records by PatentIndex Score.
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