Inventor · disambiguated record
James Frame
Also filed as: FRAME JAMES · FRAME JAMES W · FRAME JAMES WARREN
16 granted patents·2 pending applications·775 citations·filing 1998–2009
95Inventor score
Top patents by PatentIndex Score
18 records- 0199US6250933B1Contact structure and production method thereofADVANTEST CORP·Filed 2000·Granted Jun 26, 2001·209 cites·17 claims
- 0291US5989994AMethod for producing contact structuresADVANTEST CORP·Filed 1998·Granted Nov 23, 1999·82 cites·22 claims
- 0390US6218203B1Method of producing a contact structureADVANTEST CORP·Filed 1999·Granted Apr 17, 2001·120 cites·18 claims
- 0489US6472890B2Method for producing a contact structureADVANTEST CORP·Filed 2002·Granted Oct 29, 2002·35 cites·9 claims
- 0588US6420884B1Contact structure formed by photolithography processADVANTEST CORP·Filed 1999·Granted Jul 16, 2002·73 cites·7 claims
- 0688US6232669B1Contact structure having silicon finger contactors and total stack-up structure using sameADVANTEST CORP·Filed 1999·Granted May 15, 2001·70 cites·19 claims
- 0782US6466043B2Contact structure for electrical communication with contact targetsADVANTEST CORP·Filed 2002·Granted Oct 15, 2002·21 cites·7 claims
- 0880US6297164B1Method for producing contact structuresADVANTEST CORP·Filed 1998·Granted Oct 2, 2001·46 cites·19 claims
- 0978US7504841B2High-impedance attenuatorANALOG DEVICES INC·Filed 2006·Granted Mar 17, 2009·9 cites·3 claims
- 1078US6399900B1Contact structure formed over a grooveADVANTEST CORP·Filed 1999·Granted Jun 4, 2002·44 cites·10 claims
- 1175US6552528B2Modular interface between a device under test and a test headADVANTEST CORP·Filed 2001·Granted Apr 22, 2003·14 cites·26 claims
- 1274US6856158B2Comparator circuit for semiconductor test systemADVANTEST CORP·Filed 2002·Granted Feb 15, 2005·30 cites·12 claims
- 1368US7728610B2Test instrument probe with MEMS attenuator circuitANALOG DEVICES INC·Filed 2009·Granted Jun 1, 2010·5 cites·23 claims
- 1467US7292044B2Integrating time measurement circuit for a channel of a test cardANALOG DEVICES INC·Filed 2005·Granted Nov 6, 2007·5 cites·18 claims
- 1562US6822436B2Universal test interface between a device under test and a test headADVANTEST CORP·Filed 2002·Granted Nov 23, 2004·7 cites·13 claims
- 1658US6576301B1Method of producing contact structureADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·5 cites·14 claims
- 1739US2005040811A1Universal test interface between a device under test and a test headADVANTEST CORP·Filed 2004·Application pending·0 cites
- 1834US2002089322A1Modular high parallelism interface for integrated circuit testing, method of assembly, and use of sameFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →