Inventor · disambiguated record
Arnold Halperin
Also filed as: HALPERIN ARNOLD
20 granted patents·1,681 citations·filing 1982–2003
97Inventor score
Files withIBM20
Top patents by PatentIndex Score
20 records- 0197US6226619B1Method and system for preventing counterfeiting of high price wholesale and retail itemsIBM·Filed 1998·Granted May 1, 2001·355 cites·33 claims
- 0297US5559428AIn-situ monitoring of the change in thickness of filmsIBM·Filed 1995·Granted Sep 24, 1996·258 cites·19 claims
- 0397US4496900ANonlinearity detection using fault-generated second harmonicIBM·Filed 1982·Granted Jan 29, 1985·102 cites·5 claims
- 0495US6072313AIn-situ monitoring and control of conductive films by detecting changes in induced eddy currentsIBM·Filed 1997·Granted Jun 6, 2000·163 cites·12 claims
- 0595US5660672AIn-situ monitoring of conductive films on semiconductor wafersIBM·Filed 1995·Granted Aug 26, 1997·155 cites·64 claims
- 0695US5644221AEndpoint detection for chemical mechanical polishing using frequency or amplitude modeIBM·Filed 1996·Granted Jul 1, 1997·135 cites·18 claims
- 0792US5731697AIn-situ monitoring of the change in thickness of filmsIBM·Filed 1996·Granted Mar 24, 1998·108 cites·13 claims
- 0885US6115616AHand held telephone set with separable keyboardIBM·Filed 1998·Granted Sep 5, 2000·115 cites·11 claims
- 0980US5659492AChemical mechanical polishing endpoint process controlIBM·Filed 1996·Granted Aug 19, 1997·60 cites·24 claims
- 1079US4868506ADefect detection using intermodulation signalsIBM·Filed 1988·Granted Sep 19, 1989·37 cites·20 claims
- 1176US6242923B1Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boardsIBM·Filed 1998·Granted Jun 5, 2001·37 cites·29 claims
- 1271US5770948ARotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh toolIBM·Filed 1996·Granted Jun 23, 1998·36 cites·14 claims
- 1369US6400128B2Thermal modulation system and method for locating a circuit defectIBM·Filed 2001·Granted Jun 4, 2002·12 cites·17 claims
- 1468US5663637ARotary signal coupling for chemical mechanical polishing endpoint detection with a westech toolIBM·Filed 1996·Granted Sep 2, 1997·41 cites·22 claims
- 1565US6141093AMethod and apparatus for locating power plane shorts using polarized light microscopyIBM·Filed 1998·Granted Oct 31, 2000·31 cites·20 claims
- 1652US5402072ASystem and method for testing and fault isolation of high density passive boards and substratesIBM·Filed 1992·Granted Mar 28, 1995·14 cites·11 claims
- 1744US5621327ASystem and method for testing and fault isolation of high density passive boards and substratesIBM·Filed 1995·Granted Apr 15, 1997·11 cites·4 claims
- 1839US6337218B1Method to test devices on high performance ULSI wafersIBM·Filed 1999·Granted Jan 8, 2002·7 cites·12 claims
- 1935US6236196B1Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometryIBM·Filed 1999·Granted May 22, 2001·4 cites·25 claims
- 2033US7808257B2Ionization test for electrical verificationIBM·Filed 2003·Granted Oct 5, 2010·0 cites·63 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →