Inventor · disambiguated record
Masamitsu Yanagihara
Also filed as: YANAGIHARA MASAMITSU
24 granted patents·4 pending applications·1,172 citations·filing 1986–2024
97Inventor score
Top patents by PatentIndex Score
28 records- 0197US5500736AMethod of detecting positionsNIKON CORP·Filed 1994·Granted Mar 19, 1996·473 cites·2 claims
- 0291US6552775B1Exposure method and apparatusNIKON CORP·Filed 2000·Granted Apr 22, 2003·118 cites·23 claims
- 0391US5486896AExposure apparatusNIKON CORP·Filed 1994·Granted Jan 23, 1996·80 cites·13 claims
- 0490US5625436AScanning type exposure apparatus and exposure methodNIKON CORP·Filed 1996·Granted Apr 29, 1997·73 cites·14 claims
- 0586US11854288B2Image determining device to determine the state of a subjectNIKON CORP·Filed 2021·Granted Dec 26, 2023·1 cites·11 claims
- 0686US5581075AMulti-beam scanning projection exposure apparatus and method with beam monitoring and control for uniform exposure of large areaNIKON CORP·Filed 1995·Granted Dec 3, 1996·64 cites·43 claims
- 0785US5602620AScanning exposure apparatus and exposure methodNIKON CORP·Filed 1995·Granted Feb 11, 1997·63 cites·14 claims
- 0884US6288772B1Scanning exposure method and scanning type exposure apparatusNIKON CORP·Filed 2000·Granted Sep 11, 2001·28 cites·22 claims
- 0984US4687322AProjection optical apparatusNIPPON KOGAKU KK·Filed 1986·Granted Aug 18, 1987·39 cites·22 claims
- 1082US2025095398A1Image determining device to determine the state of a subjectNIKON CORP·Filed 2024·Application pending·0 cites
- 1182US2024078831A1An image determining device to determine the state of a subjectNIKON CORP·Filed 2023·Application pending·0 cites
- 1280US5617181AExposure apparatus and exposure methodNIKON CORP·Filed 1996·Granted Apr 1, 1997·46 cites·25 claims
- 1378US10255491B2Guidance system, detection device, and position assessment deviceSEKIGUCHI MASAKAZU·Filed 2011·Granted Apr 9, 2019·12 cites·13 claims
- 1474US5999244AProjection exposure apparatus, method for correcting positional discrepancy of projected image, and method for determining image formation characteristic of projection optical systemNIKON CORP·Filed 1996·Granted Dec 7, 1999·36 cites·15 claims
- 1574US5502313AExposure apparatus and method having a measuring unit for measuring distances between a mask surface and a projection optical systemNIKON CORP·Filed 1994·Granted Mar 26, 1996·26 cites·10 claims
- 1668US11055522B2Image determining device to determine the state of a subjectNIKON CORP·Filed 2019·Granted Jul 6, 2021·0 cites·10 claims
- 1767US5623343AExposure method and apparatusNIKON CORP·Filed 1995·Granted Apr 22, 1997·27 cites·23 claims
- 1865US6325516B1Exposure apparatus and field stop thereofNIPPON KOGAKU KK·Filed 2000·Granted Dec 4, 2001·7 cites·19 claims
- 1965US5640243APosition detection methodNIKON CORP·Filed 1995·Granted Jun 17, 1997·25 cites·6 claims
- 2064US9047751B2Image determining device to determine the state of a subjectYAMAMOTO TETSUYA·Filed 2010·Granted Jun 2, 2015·1 cites·25 claims
- 2163US10275645B2Image determining device to determine the state of a subjectNIKON CORP·Filed 2017·Granted Apr 30, 2019·0 cites·11 claims
- 2259US6213607B1Exposure apparatus and field stop thereofNIKON CORP·Filed 1999·Granted Apr 10, 2001·16 cites·22 claims
- 2353US2015235077A1Image determining device to determine the state of a subjectNIKON CORP·Filed 2015·Application pending·0 cites
- 2450US5978094AAlignment device and method based on imaging characteristics of the image pickup systemNIKON CORP·Filed 1997·Granted Nov 2, 1999·16 cites·30 claims
- 2543USRE37762EScanning exposure apparatus and exposure methodNIPPON KOGAKU KK·Filed 1999·Granted Jun 25, 2002·8 cites·44 claims
- 2640USRE37361EScanning type exposure apparatus and exposure methodNIPPON KOGAKU KK·Filed 1999·Granted Sep 11, 2001·5 cites·61 claims
- 2740US2013321625A1Electronic device and information transmission systemYANAGIHARA MASAMITSU·Filed 2012·Application pending·0 cites
- 2839US5936712AExposure method and apparatus including focus controlNIKON CORP·Filed 1998·Granted Aug 10, 1999·8 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →