Inventor · disambiguated record
Tetsuya Yoshikawa
Also filed as: YOSHIKAWA TETSUYA
13 granted patents·3 pending applications·64 citations·filing 1990–2022
88Inventor score
Top patents by PatentIndex Score
16 records- 0173US12386346B2Support deviceTOYOTA MOTOR CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·9 claims
- 0272US5103766AVacuum arc vapor deposition device having electrode switching meansKOBE STEEL LTD·Filed 1990·Granted Apr 14, 1992·34 cites·2 claims
- 0368US8342020B2Tire testing machine and tire testing methodKOBE STEEL LTD·Filed 2009·Granted Jan 1, 2013·6 cites·8 claims
- 0464US9046444B2Tire testing deviceWAKAZONO TAKEHIKO·Filed 2011·Granted Jun 2, 2015·2 cites·29 claims
- 0564US7513265B2High pressure processing method and apparatusKOBE STEEL LTD·Filed 2003·Granted Apr 7, 2009·10 cites·7 claims
- 0664US7335596B2Method for fabricating copper-based interconnections for semiconductor deviceKOBE STEEL LTD·Filed 2005·Granted Feb 26, 2008·3 cites·6 claims
- 0760US11915536B2Anomaly determination apparatusTOYOTA MOTOR CO LTD·Filed 2021·Granted Feb 27, 2024·0 cites·21 claims
- 0858US7520938B2Method for high-pressure processingKOBE STEEL LTD·Filed 2004·Granted Apr 21, 2009·3 cites·9 claims
- 0956US12024180B2Abnormality determination deviceTOYOTA MOTOR CO LTD·Filed 2021·Granted Jul 2, 2024·0 cites·10 claims
- 1056US7220714B2Process and composition for removing residues from the microstructure of an objectAIR PROD & CHEM·Filed 2004·Granted May 22, 2007·5 cites·5 claims
- 1150US11796054B2Anomaly determination device for power transmission deviceTOYOTA MOTOR CO LTD·Filed 2021·Granted Oct 24, 2023·0 cites·15 claims
- 1246US8136393B2Tire testing machine and method for testing tireYOSHIKAWA TETSUYA·Filed 2009·Granted Mar 20, 2012·1 cites·8 claims
- 1342US2022042842A1Device for vehicle including power transfer deviceTOYOTA MOTOR CO LTD·Filed 2021·Application pending·0 cites
- 1439US2004226588A1Cleaning apparatusKOBE STEEL LTD·Filed 2004·Application pending·0 cites
- 1537US6916735B2Method for forming aerial metallic wiring on semiconductor substrateKOBE STEEL LTD·Filed 2002·Granted Jul 12, 2005·0 cites·8 claims
- 1637US2003217764A1Process and composition for removing residues from the microstructure of an objectFiled 2002·Application pending·0 cites
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