Inventor · disambiguated record
Taeyoon An
Also filed as: AN TAEYOON
5 granted patents·6 pending applications·71 citations·filing 2012–2025
74Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0195US10057470B2Electronic device and photographing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 21, 2018·65 cites·20 claims
- 0283US10411224B2Display device with anti-reflection layer, and electronic device with the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 10, 2019·4 cites·20 claims
- 0362US9094759B2Earphone connection detecting system and mobile device for supporting the systemSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jul 28, 2015·2 cites·16 claims
- 0461US2025351426A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0555US2025356686A1Method of controlling fingerprint sensor and electronic device supporting sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0653US12182486B2System and method for modeling damages caused by incident particlesSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 31, 2024·0 cites·20 claims
- 0752US2024315008A1Semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0849US10511257B2Photovoltaic cell having polarization characteristic and electronic device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 17, 2019·0 cites·20 claims
- 0943US2022268830A1Method for predicting defect in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 1043US2024320402A1Method, device, and system for estimating threshold value of kernel density function with respect to defect of productSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1136US2018260094A1Electronic device and function control method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →