Inventor · disambiguated record
Vladimir N. Faifer
Also filed as: FAIFER VLADIMIR · FAIFER VLADIMIR N
15 granted patents·160 citations·filing 2000–2019
92Inventor score
Top patents by PatentIndex Score
15 records- 0191US7019513B1Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctionsFAIFER VLADIMIR·Filed 2005·Granted Mar 28, 2006·32 cites·19 claims
- 0289US7642772B1Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafersAHBEE 1 L P·Filed 2007·Granted Jan 5, 2010·14 cites·8 claims
- 0388US7414409B1Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafersFAIFER VLADIMIR·Filed 2005·Granted Aug 19, 2008·23 cites·9 claims
- 0488US6512384B1Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltagesSEMICONDUCTOR DIAGNOSTICS INC·Filed 2000·Granted Jan 28, 2003·52 cites·33 claims
- 0580US7034563B1Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodesAHBEE 2 L P A CALIFORNIA LTD P·Filed 2005·Granted Apr 25, 2006·16 cites·7 claims
- 0674US9823198B2Method and apparatus for non-contact measurement of internal quantum efficiency in light emitting diode structuresKLA TENCOR CORP·Filed 2014·Granted Nov 21, 2017·2 cites·30 claims
- 0770US7362088B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2003·Granted Apr 22, 2008·9 cites·11 claims
- 0869US7737680B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·3 cites·3 claims
- 0966US7804294B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsABHEE 1 L P·Filed 2009·Granted Sep 28, 2010·3 cites·1 claims
- 1063US9746514B2Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctionsKLA TENCOR CORP·Filed 2014·Granted Aug 29, 2017·2 cites·27 claims
- 1162US7741833B1Non contact method and apparatus for measurement of sheet resistance of p-n junctionsAHBEE 1 L P·Filed 2006·Granted Jun 22, 2010·2 cites·1 claims
- 1259US9880200B2Method and apparatus for non-contact measurement of forward voltage, saturation current density, ideality factor and I-V curves in P-N junctionsKLA TENCOR CORP·Filed 2014·Granted Jan 30, 2018·1 cites·46 claims
- 1357US7737681B1Non contact method and apparatus for measurement of sheet resistance of P-N junctionsAHBEE 1 L P·Filed 2009·Granted Jun 15, 2010·1 cites·5 claims
- 1450US11442090B2Systems and methods for measuring electrical characteristics of a material using a non-destructive multi-point probeUTICA LEASECO LLC·Filed 2019·Granted Sep 13, 2022·0 cites·18 claims
- 1541US9921261B2Method and apparatus for non-contact measurement of sheet resistance and shunt resistance of p-n junctionsKLA TENCOR CORP·Filed 2014·Granted Mar 20, 2018·0 cites·21 claims
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