Inventor · disambiguated record
Yi-Hong Tseng
Also filed as: TSENG YI-HONG
10 granted patents·2 pending applications·89 citations·filing 2003–2015
86Inventor score
Top patents by PatentIndex Score
12 records- 0195US9325899B1Image capturing device and digital zooming method thereofALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Apr 26, 2016·65 cites·22 claims
- 0277US9225909B1Image capturing device and digital zoom display methodALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Dec 29, 2015·5 cites·6 claims
- 0370US9386229B2Image processing system and method for object-tracingALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Jul 5, 2016·2 cites·9 claims
- 0465US9344629B2Method of capturing images and image capturing device using the methodALTEK SEMICONDUCTOR CORP·Filed 2014·Granted May 17, 2016·1 cites·9 claims
- 0561US7003362B2System and method for customized tape-out requests for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 21, 2006·7 cites·30 claims
- 0660US7296254B2System and method for using MPW integration service on demandTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Nov 13, 2007·2 cites·13 claims
- 0759US7904855B2Methods for partially removing circuit patterns from a multi-project waferTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Mar 8, 2011·1 cites·20 claims
- 0858US6964030B2Method for automatic mask tool translationTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Nov 8, 2005·6 cites·23 claims
- 0948US2016080657A1Image capturing device and digital zoom methodALTEK SEMICONDUCTOR CORP·Filed 2014·Application pending·0 cites
- 1047US9743007B2Lens module array, image sensing device and fusing method for digital zoomed imagesALTEK SEMICONDUCTOR CORP·Filed 2015·Granted Aug 22, 2017·0 cites·15 claims
- 1142US2006026549A1Method and system for conducting an online transaction of multi-project wafer serviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Application pending·0 cites
- 1240US9565361B2Image capturing device and hybrid image processing method thereofALTEK SEMICONDUCTOR CORP·Filed 2015·Granted Feb 7, 2017·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →