Inventor · disambiguated record
Shih-Chin Lien
Also filed as: LIEN SHIH-CHIN
50 granted patents·9 pending applications·167 citations·filing 2006–2015
97Inventor score
Top patents by PatentIndex Score
59 records- 0197US8357547B2Semiconductor bio-sensors and methods of manufacturing the sameMACRONIX INT CO LTD·Filed 2012·Granted Jan 22, 2013·55 cites·20 claims
- 0295US8227877B2Semiconductor bio-sensors and methods of manufacturing the sameLEE MING-TUNG·Filed 2010·Granted Jul 24, 2012·57 cites·7 claims
- 0388US9082841B1Semiconductor device having metal layer over drift regionMACRONIX INT CO LTD·Filed 2014·Granted Jul 14, 2015·9 cites·20 claims
- 0481US9305993B2Method of manufacturing semiconductor structureMACRONIX INT CO LTD·Filed 2015·Granted Apr 5, 2016·3 cites·5 claims
- 0580US9035386B2Semiconductor structure and method for manufacturing the sameMACRONIX INT CO LTD·Filed 2012·Granted May 19, 2015·4 cites·19 claims
- 0676US8017486B2Method of fabricating low on-resistance lateral double-diffused MOS deviceMACRONIX INT CO LTD·Filed 2007·Granted Sep 13, 2011·6 cites·8 claims
- 0775US9257555B1Semiconductor structureMACRONIX INT CO LTD·Filed 2014·Granted Feb 9, 2016·5 cites·19 claims
- 0870US9269806B2Semiconductor device and method of fabricating sameMACRONIX INT CO LTD·Filed 2013·Granted Feb 23, 2016·2 cites·7 claims
- 0968US8921933B2Semiconductor structure and method for operating the sameWU SHYI-YUAN·Filed 2011·Granted Dec 30, 2014·3 cites·14 claims
- 1067US9312380B2Semiconductor device having deep implantation region and method of fabricating sameMACRONIX INT CO LTD·Filed 2014·Granted Apr 12, 2016·2 cites·17 claims
- 1167US7829408B2Laterally double-diffused metal oxide semiconductor transistor and method for fabricating the sameMACRONIX INT CO LTD·Filed 2009·Granted Nov 9, 2010·3 cites·8 claims
- 1266US9466700B2Semiconductor device and method of fabricating sameMACRONIX INT CO LTD·Filed 2015·Granted Oct 11, 2016·1 cites·20 claims
- 1366US7868370B2Single gate nonvolatile memory cell with transistor and capacitorMACRONIX INT CO LTD·Filed 2008·Granted Jan 11, 2011·3 cites·21 claims
- 1465US8928095B2Semiconductor device having reduced leakage current at breakdown and method of fabricating thereofMACRONIX INT CO LTD·Filed 2013·Granted Jan 6, 2015·1 cites·21 claims
- 1563US8890244B2Lateral power MOSFET structure and method of manufactureLIN CHENG-CHI·Filed 2010·Granted Nov 18, 2014·2 cites·7 claims
- 1662US8258042B2Buried layer of an integrated circuitHUANG YIN-FU·Filed 2009·Granted Sep 4, 2012·2 cites·20 claims
- 1762US7525153B2Laterally double-diffused metal oxide semiconductor transistor and method for fabricating the sameMACRONIX INT CO LTD·Filed 2006·Granted Apr 28, 2009·2 cites·7 claims
- 1861US9070766B1Semiconductor device and method of forming the sameMACRONIX INT CO LTD·Filed 2014·Granted Jun 30, 2015·1 cites·12 claims
- 1960US8525243B2Single gate semiconductor deviceLIN CHENG-CHI·Filed 2011·Granted Sep 3, 2013·1 cites·20 claims
- 2059US8421124B2High-beta bipolar junction transistor and method of manufactureLIN CHENG-CHI·Filed 2010·Granted Apr 16, 2013·1 cites·12 claims
- 2158US7999296B2Single gate nonvolatile memory cell with transistor and capacitorMACRONIX INT CO LTD·Filed 2008·Granted Aug 16, 2011·1 cites·22 claims
- 2257US9231078B2Semiconductor and manufacturing method thereofMACRONIX INT CO LTD·Filed 2012·Granted Jan 5, 2016·1 cites·6 claims
- 2356US9633852B2Semiconductor structure and method for forming the sameMACRONIX INT CO LTD·Filed 2014·Granted Apr 25, 2017·0 cites·13 claims
- 2456US8940609B2MOS device and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2014·Granted Jan 27, 2015·0 cites·11 claims
- 2556US8482059B2Semiconductor structure and manufacturing method for the sameLIN CHEN-YUAN·Filed 2011·Granted Jul 9, 2013·1 cites·10 claims
- 2656US8304830B2LDPMOS structure for enhancing breakdown voltage and specific on resistance in biCMOS-DMOS processHUANG YIN-FU·Filed 2010·Granted Nov 6, 2012·1 cites·7 claims
- 2753US8679930B2Semiconductor structure and manufacturing method for the sameMACRONIX INT CO LTD·Filed 2013·Granted Mar 25, 2014·0 cites·9 claims
- 2852US9000519B2Semiconductor device having varying p-top and n-grade regionsMACRONIX INT CO LTD·Filed 2012·Granted Apr 7, 2015·0 cites·14 claims
- 2952US8980717B2Ultra-high voltage N-type-metal-oxide-semiconductor (UHV NMOS) device and methods of manufacturing the sameMACRONIX INT CO LTD·Filed 2013·Granted Mar 17, 2015·0 cites·11 claims
- 3051US9171763B2Methods of manufacturing a semiconductor device having varying p-top and n-grade regionsMACRONIX INT CO LTD·Filed 2015·Granted Oct 27, 2015·0 cites·20 claims
- 3151US8963277B2Semiconductor structure and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2013·Granted Feb 24, 2015·0 cites·17 claims
- 3250US9018069B2Semiconductor structure and a method for manufacturing the sameMACRONIX INT CO LTD·Filed 2013·Granted Apr 28, 2015·0 cites·11 claims
- 3349US8981451B2Semiconductor memory devicesMACRONIX INT CO LTD·Filed 2013·Granted Mar 17, 2015·0 cites·8 claims
- 3448US9443754B2Semiconductor device including high-voltage diodeMACRONIX INT CO LTD·Filed 2014·Granted Sep 13, 2016·0 cites·16 claims
- 3548US8829615B2MOS device and method of manufacturing the sameCHEN CHIEN-CHUNG·Filed 2011·Granted Sep 9, 2014·0 cites·14 claims
- 3648US8790984B2High-beta bipolar junction transistor and method of manufactureMACRONIX INT CO LTD·Filed 2013·Granted Jul 29, 2014·0 cites·7 claims
- 3747US8507993B2Buried layer of an integrated circuitHUANG YIN-FU·Filed 2012·Granted Aug 13, 2013·0 cites·18 claims
- 3846US8969870B2Pattern for ultra-high voltage semiconductor device manufacturing and process monitoringMACRONIX INT CO LTD·Filed 2013·Granted Mar 3, 2015·0 cites·20 claims
- 3946US8872222B2Semiconductor structure and method for forming the sameCHAN CHING-LIN·Filed 2012·Granted Oct 28, 2014·0 cites·15 claims
- 4045US9202862B2Semiconductor structure and manufacturing method of the sameMACRONIX INT CO LTD·Filed 2014·Granted Dec 1, 2015·0 cites·18 claims
- 4145US8610209B2Ultra-high voltage N-type-metal-oxide-semiconductor (UHV NMOS) device and methods of manufacturing the sameCHEN CHIEH-CHIH·Filed 2011·Granted Dec 17, 2013·0 cites·13 claims
- 4245US8564099B2Semiconductor structure and a method for manufacturing the sameCHEN CHIEH-CHIH·Filed 2011·Granted Oct 22, 2013·0 cites·11 claims
- 4345US8362558B2Low on-resistance lateral double-diffused MOS deviceMACRONIX INT CO LTD·Filed 2011·Granted Jan 29, 2013·0 cites·8 claims
- 4445US2013037883A1Ldpmos structure for enhancing breakdown voltage and specific on resistance in bicmos-dmos processMACRONIX INT CO LTD·Filed 2012·Application pending·0 cites
- 4543US8487360B2Semiconductor memory devices with high gate coupling ratio and methods of manufacturing the sameLIN CHENG-CHI·Filed 2010·Granted Jul 16, 2013·0 cites·14 claims
- 4642US2015214361A1Semiconductor Device Having Partial Insulation Structure And Method Of Fabricating SameMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 4742US2014197467A1High voltage junction field effect transistor structureMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
- 4841US9450048B2Semiconductor device and manufacturing method and operating method for the sameMACRONIX INT CO LTD·Filed 2013·Granted Sep 20, 2016·0 cites·9 claims
- 4941US2014264855A1Semiconductor composite layer structure and semiconductor packaging structure having the same thereofMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
- 5040US2015048452A1Ultra-high voltage semiconductor having an isolated structure for high side operation and method of manufactureMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →