Inventor · disambiguated record
Fumihiko Arakawa
Also filed as: ARAKAWA FUMIHIKO
11 granted patents·2 pending applications·88 citations·filing 1998–2005
90Inventor score
Top patents by PatentIndex Score
13 records- 0175US6333881B1Semiconductor memoryHITACHI LTD·Filed 2000·Granted Dec 25, 2001·23 cites·13 claims
- 0264US6337581B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2000·Granted Jan 8, 2002·9 cites·28 claims
- 0361US6229745B1Semiconductor memoryHITACHI LTD·Filed 2000·Granted May 8, 2001·12 cites·6 claims
- 0460US6075729AHigh-speed static random access memoryHITACHI LTD·Filed 1998·Granted Jun 13, 2000·20 cites·14 claims
- 0557US6677782B2Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitHITACHI LTD·Filed 2001·Granted Jan 13, 2004·7 cites·2 claims
- 0651US6807115B2Method of testing a semiconductor integrated deviceRENESAS TECH CORP·Filed 2003·Granted Oct 19, 2004·4 cites·3 claims
- 0748US7212744B2Receiver circuit and transmitter circuitRENESAS TECH CORP·Filed 2004·Granted May 1, 2007·5 cites·19 claims
- 0848US6438050B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2002·Granted Aug 20, 2002·3 cites·2 claims
- 0946US2006119970A1Semiconductor device and magnetic recording system using the sameHITACHI LTD·Filed 2005·Application pending·0 cites
- 1044US6617610B2Semiconductor integrated circuitHITACHI LTD·Filed 2001·Granted Sep 9, 2003·2 cites·14 claims
- 1142US6998878B2Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitHITACHI DEVICE ENG·Filed 2004·Granted Feb 14, 2006·2 cites·14 claims
- 1239US6356493B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2000·Granted Mar 12, 2002·1 cites·1 claims
- 1334US2002196053A1Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →