Inventor · disambiguated record
Wayland Bart Holland
Also filed as: HOLLAND WAYLAND B · HOLLAND WAYLAND BART
17 granted patents·621 citations·filing 1991–2000
96Inventor score
Top patents by PatentIndex Score
17 records- 0196US5467306AMethod of using source bias to increase threshold voltages and/or to correct for over-erasure of flash epromsTEXAS INSTRUMENTS INC·Filed 1993·Granted Nov 14, 1995·160 cites·19 claims
- 0289US5995409AElectrically-programmable read-only memory fabricated using a dynamic random access memory fabrication process and methods for programming sameSILICON AQUARIUS INC·Filed 1998·Granted Nov 30, 1999·81 cites·20 claims
- 0383US5963497ADynamic random access memory system with simultaneous access and refresh operations and methods for using the sameSILICON AQUARIUS INC·Filed 1998·Granted Oct 5, 1999·47 cites·18 claims
- 0482US5940329AMemory architecture and systems and methods using the sameSILICON AQUARIUS INC·Filed 1997·Granted Aug 17, 1999·49 cites·17 claims
- 0581US6396764B1Segmented memory architecture and systems and methods using the sameSILICON AQUARIUS INC·Filed 2000·Granted May 28, 2002·31 cites·18 claims
- 0680US6282606B1Dynamic random access memories with hidden refresh and utilizing one-transistor, one-capacitor cells, systems and methodsSILICON AQUARIUS INC·Filed 1999·Granted Aug 28, 2001·44 cites·12 claims
- 0778US6418063B1Memory architecture and systems and methods using the sameSILICON AQUARIUS INC·Filed 1999·Granted Jul 9, 2002·39 cites·18 claims
- 0877US6256221B1Arrays of two-transistor, one-capacitor dynamic random access memory cells with interdigitated bitlinesSILICON AQUARIUS INC·Filed 2000·Granted Jul 3, 2001·26 cites·13 claims
- 0974US5278458AThreshold/voltage detection circuitTEXAS INSTRUMENTS INC·Filed 1991·Granted Jan 11, 1994·26 cites·18 claims
- 1072US6222216B1Non-volatile and memory fabricated using a dynamic memory process and method thereforSILICON AQUARIUS INC·Filed 1997·Granted Apr 24, 2001·28 cites·12 claims
- 1167US5526315ABiasing circuit and method to achieve compaction and self-limiting erase in flash EEPROMSTEXAS INSTRUMENTS INC·Filed 1995·Granted Jun 11, 1996·23 cites·9 claims
- 1266US5596528AMethod of using source bias to raise threshold voltages and/or to compact threshold voltagesTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 21, 1997·21 cites·5 claims
- 1361US5428578ABiasing circuit and method to achieve compaction and self-limiting erase in flash EEPROMsTEXAS INSTRUMENTS INC·Filed 1993·Granted Jun 27, 1995·17 cites·21 claims
- 1443US6222786B1Dynamic random access memory with write-without-restore and systems and methods using the sameSILICON AQUARIUS INC·Filed 1999·Granted Apr 24, 2001·15 cites·21 claims
- 1540US5705404AMethod of implant verification in semiconductor device using reticle specific indicatorTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 6, 1998·7 cites·2 claims
- 1633US5403753AMethod of forming implant indicators for implant verificationTEXAS INSTRUMENTS INC·Filed 1993·Granted Apr 4, 1995·5 cites·4 claims
- 1731US5594258ASemiconductor device with reticle specific implant verification indicatorTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 14, 1997·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →