Inventor · disambiguated record
Takashi Matsuzaka
Also filed as: MATSUZAKA TAKASHI
14 granted patents·255 citations·filing 1981–1999
93Inventor score
Top patents by PatentIndex Score
14 records- 0188US4896514AAir-conditioning apparatusTOSHIBA KK·Filed 1988·Granted Jan 30, 1990·64 cites·17 claims
- 0276US4442682ATurbine for use in refrigeration cycleTOKYO SHIBAURA ELECTRIC CO·Filed 1982·Granted Apr 17, 1984·37 cites·7 claims
- 0370US6225011B1Method for manufacturing semiconductor devices utilizing plurality of exposure systemsHITACHI LTD·Filed 1999·Granted May 1, 2001·38 cites·10 claims
- 0470US4382182AMethod of displaying an image of phase contrast in a scanning transmission electron microscopeHITACHI LTD·Filed 1981·Granted May 3, 1983·14 cites·6 claims
- 0567US6511048B1Electron beam lithography apparatus and pattern forming methodHITACHI LTD·Filed 1998·Granted Jan 28, 2003·20 cites·15 claims
- 0660US4701620AElectron beam exposure apparatusHITACHI LTD·Filed 1986·Granted Oct 20, 1987·10 cites·3 claims
- 0760US4642046APulse combustorTOSHIBA KK·Filed 1984·Granted Feb 10, 1987·18 cites·20 claims
- 0851US4808829AMark position detection system for use in charged particle beam apparatusHITACHI LTD·Filed 1987·Granted Feb 28, 1989·8 cites·4 claims
- 0946US4687435APulse combustorTOSHIBA KK·Filed 1985·Granted Aug 18, 1987·10 cites·15 claims
- 1045US4577111AApparatus for electron beam lithographyHITACHI LTD·Filed 1983·Granted Mar 18, 1986·12 cites·6 claims
- 1137US5326979AElectron beam lithography systemHITACHI LTD·Filed 1992·Granted Jul 5, 1994·4 cites·12 claims
- 1236US4897628AGas sensor and method of manufacturing the sameOSAKA GAS CO LTD·Filed 1987·Granted Jan 30, 1990·8 cites·7 claims
- 1336US4477246ASilencer unitSUZUYE AND SUZUYE·Filed 1983·Granted Oct 16, 1984·7 cites·8 claims
- 1435US4414139ACatalyst carriers for purification of waste gas and process for preparing the sameTOKYO SHIBAURA ELECTRIC CO·Filed 1982·Granted Nov 8, 1983·5 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →