Inventor · disambiguated record
Tomihiro Hashizume
Also filed as: HASHIZUME TOMIHIRO
38 granted patents·13 pending applications·248 citations·filing 1996–2023
97Inventor score
Files withHITACHI LTD27HITACHI HIGH TECH CORP14SHICHI HIROYASU2YAMAMOTO TSUYOSHI2HASHIZUME TOMIHIRO1
Top patents by PatentIndex Score
51 records- 0194US8115184B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2008·Granted Feb 14, 2012·20 cites·15 claims
- 0289US7772622B2Field effect transistor and manufacturing method thereofHITACHI LTD·Filed 2007·Granted Aug 10, 2010·13 cites·19 claims
- 0388US7622734B2Organic transistor using self-assembled monolayerHITACHI LTD·Filed 2007·Granted Nov 24, 2009·11 cites·3 claims
- 0486US5801472AMicro-fabricated device with integrated electrostatic actuatorHITCHI LTD·Filed 1996·Granted Sep 1, 1998·98 cites·32 claims
- 0585US10707046B2Electron source and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 7, 2020·3 cites·13 claims
- 0684US7608857B2Field effect transistor having a structure in which an organic semiconductor that forms a channel is made of a single crystal or a polycrystal of organic moleculesHITACHI LTD·Filed 2006·Granted Oct 27, 2009·8 cites·4 claims
- 0780US7807496B2Field effect transistor and its manufacturing methodHITACHI LTD·Filed 2005·Granted Oct 5, 2010·6 cites·15 claims
- 0879US10522319B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 31, 2019·2 cites·15 claims
- 0979US8847173B2Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing sameKAWANAMI YOSHIMI·Filed 2011·Granted Sep 30, 2014·5 cites·9 claims
- 1078US7115863B1Probe for scanning probe lithography and making method thereofHITACHI LTD·Filed 2000·Granted Oct 3, 2006·16 cites·11 claims
- 1177US6366340B1Electron exposure apparatusHITACHI LTD·Filed 1998·Granted Apr 2, 2002·28 cites·21 claims
- 1274US8530865B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2012·Granted Sep 10, 2013·2 cites·13 claims
- 1373US7872254B2Wiring and organic transistor, and manufacturing method thereofHITACHI LTD·Filed 2007·Granted Jan 18, 2011·5 cites·8 claims
- 1468US8008654B2Thin-film transistor device and a method for manufacturing the sameHITACHI LTD·Filed 2008·Granted Aug 30, 2011·2 cites·13 claims
- 1566US9875878B2Sample holder and analytical vacuum deviceHITACHI LTD·Filed 2013·Granted Jan 23, 2018·1 cites·9 claims
- 1664US12400823B2Electron source, method of manufacturing the same, and electron beam apparatus using the sameHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 26, 2025·0 cites·15 claims
- 1763US7872257B2Organic thin film transistor array and method of manufacturing the sameHITACHI LTD·Filed 2008·Granted Jan 18, 2011·1 cites·8 claims
- 1858US6670622B2Electron exposure device and method and electronic characteristics evaluation device using scanning probeHITACHI LTD·Filed 2002·Granted Dec 30, 2003·3 cites·12 claims
- 1958US2024126061A1Scanning probe microscopeHITACHI LTD·Filed 2023·Application pending·0 cites
- 2057US12494338B2Electron source, electron beam device, and method for manufacturing electron sourceHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 9, 2025·0 cites·8 claims
- 2156US2009152462A1Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 2255US11143606B2Particle measuring device and particle measuring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·0 cites·15 claims
- 2355US10697767B2Sample for measuring particles, method for measuring particles and apparatus for measuring particlesHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 30, 2020·0 cites·6 claims
- 2455US9423416B2Scanning probe microscope and measuring method using sameNAMBU AKIRA·Filed 2012·Granted Aug 23, 2016·1 cites·15 claims
- 2555US2025316438A1Field emission electron source, method of producing same, and electron beam device using sameHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2655US2013087704A1Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation methodHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 2754US7557662B2Oscillator and frequency detectorHITACHI LTD·Filed 2007·Granted Jul 7, 2009·3 cites·7 claims
- 2851US11322329B2Electron source, method for manufacturing the same, and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2018·Granted May 3, 2022·0 cites·11 claims
- 2951US7799701B2Method of coating substrateHITACHI LTD·Filed 2008·Granted Sep 21, 2010·0 cites·4 claims
- 3049US10073116B2Scanning probe microscope and its sample holderHITACHI LTD·Filed 2014·Granted Sep 11, 2018·0 cites·13 claims
- 3149US6780698B2Semiconductor device and its production methodHITACHI LTD·Filed 2002·Granted Aug 24, 2004·2 cites·10 claims
- 3248US6475650B2Ferromagnetic material and magnetic apparatus employing the ferromagnetic materialHITACHI LTD·Filed 2001·Granted Nov 5, 2002·1 cites·19 claims
- 3347US10586674B2Field emission electron source, method for manufacturing same, and electron beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 10, 2020·0 cites·11 claims
- 3447US10211022B2Ion beam apparatus and ion beam irradiation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 19, 2019·0 cites·15 claims
- 3547US7298594B2Electric-field-effect magnetoresistive devices and electronic devices using the magnetoresistive devicesHITACHI LTD·Filed 2004·Granted Nov 20, 2007·4 cites·7 claims
- 3646US2013279652A1Measuring apparatusHITACHI LTD·Filed 2013·Application pending·0 cites
- 3746US2008012009A1Field effect transistor, organic thin-film transistor and manufacturing method of organic transistorHASHIZUME TOMIHIRO·Filed 2007·Application pending·0 cites
- 3843US10971329B2Field ionization source, ion beam apparatus, and beam irradiation methodHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 6, 2021·0 cites·22 claims
- 3943US10840070B2Ion beam device and cleaning method for gas field ion sourceHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 17, 2020·0 cites·16 claims
- 4042US2012185173A1Neural activity measurement systemYAMAMOTO TSUYOSHI·Filed 2012·Application pending·0 cites
- 4142US2008099760A1Picture element driving circuit of display panel and display device using the sameHITACHI LTD·Filed 2007·Application pending·0 cites
- 4240US2005196675A1Rechargeable lithium battery containing ion-irradiated carbonaceous material and production thereofFiled 2004·Application pending·0 cites
- 4339US2004207961A1MR (magnetoresistance) device and magnetic recording deviceFiled 2003·Application pending·0 cites
- 4438US2015192604A1Holder for probe microscope, probe microscope and specimen measurement methodYAMAMOTO TSUYOSHI·Filed 2012·Application pending·0 cites
- 4538US2004228024A1Magnetization control method and information recording apparatusHITACHI LTD·Filed 2003·Application pending·0 cites
- 4636US5968677AFerromagnetic material and magnetic apparatus employing the ferromagnetic materialHITACHI LTD·Filed 1997·Granted Oct 19, 1999·6 cites·26 claims
- 4734US6187458B1Ferromagnetic fine line and magnetic apparatus thereofHITACHI LTD·Filed 1998·Granted Feb 13, 2001·2 cites·15 claims
- 4833US6299990B1Ferromagnetic material and magnetic apparatus employing the ferromagnetic materialHITACHI LTD·Filed 1999·Granted Oct 9, 2001·3 cites·18 claims
- 4932US6153500AAtomic wire and atomic wire switchHITACHI LTD·Filed 2000·Granted Nov 28, 2000·0 cites·4 claims
- 5032US6114762AAtomic wire and atomic wire switchHITACHI LTD·Filed 1997·Granted Sep 5, 2000·2 cites·10 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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