Inventor · disambiguated record
Poh Boon Yong
Also filed as: YONG POH BOON
4 granted patents·12 citations·filing 2013–2017
68Inventor score
Files withKLA TENCOR CORP4
Top patents by PatentIndex Score
4 records- 0182US10133263B1Process condition based dynamic defect inspectionKLA TENCOR CORP·Filed 2015·Granted Nov 20, 2018·5 cites·22 claims
- 0277US10204290B2Defect review sampling and normalization based on defect and design attributesKLA TENCOR CORP·Filed 2017·Granted Feb 12, 2019·5 cites·14 claims
- 0363US9277186B2Generating a wafer inspection process using bit failures and virtual inspectionKLA TENCOR CORP·Filed 2013·Granted Mar 1, 2016·2 cites·37 claims
- 0440US10014229B2Generating a wafer inspection process using bit failures and virtual inspectionKLA TENCOR CORP·Filed 2016·Granted Jul 3, 2018·0 cites·39 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →