Inventor · disambiguated record
Patrick Chapon
Also filed as: CHAPON PATRICK
7 granted patents·1 pending application·6 citations·filing 2002–2023
73Inventor score
Top patents by PatentIndex Score
8 records- 0171US10073038B2Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sampleHORIBA JOBIN YVON SAS·Filed 2015·Granted Sep 11, 2018·2 cites·20 claims
- 0258US10361075B2Process and apparatus for measuring an organic solid sample by glow discharge spectrometryHORIBA JOBIN YVON SAS·Filed 2015·Granted Jul 23, 2019·1 cites·20 claims
- 0358US2023349832A1High spectral and temporal resolution glow discharge spectrometry device and methodHORIBA FRANCE SAS·Filed 2023·Application pending·0 cites
- 0456US6784989B2Process and apparatus for real-time determination of a solid sample composition as a function of the depth within the sampleJOBIN YVON S A·Filed 2002·Granted Aug 31, 2004·3 cites·13 claims
- 0540US9508539B2Glow discharge mass spectrometry method and deviceHORIBA JOBIN YVON SAS·Filed 2014·Granted Nov 29, 2016·0 cites·18 claims
- 0638US7227635B2Device and method for positioning a sample mounted on a glow discharge spectrometerJOBIN YVON SAS·Filed 2002·Granted Jun 5, 2007·0 cites·9 claims
- 0726US8581180B2Method and device for measuring glow discharge spectrometry in pulsed modeCHAPON PATRICK·Filed 2011·Granted Nov 12, 2013·0 cites·10 claims
- 0823US8581494B2Discharge lamp for GDS with an axial magnetic fieldGANCIU-PETCU MIHAI·Filed 2010·Granted Nov 12, 2013·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →