Inventor · disambiguated record
Kwang-Myoung Rho
Also filed as: RHO KWANG M · RHO KWANG MYOUNG
31 granted patents·8 pending applications·431 citations·filing 1994–2022
96Inventor score
Files withHYNIX SEMICONDUCTOR INC18RHO KWANG-MYOUNG7HYUNDAI ELECTRONICS IND6SK HYNIX INC4CONVERSANT INTELLECTUAL PROPERTY MAN INC1
Top patents by PatentIndex Score
39 records- 0192US5861334AMethod for fabricating semiconductor device having a buried channelHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jan 19, 1999·128 cites·10 claims
- 0290US7123531B2Differential amplifier and bit-line sense amplifier adopting the sameHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Oct 17, 2006·17 cites·4 claims
- 0390US6010926AMethod for forming multiple or modulated wells of semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 1997·Granted Jan 4, 2000·108 cites·5 claims
- 0483US8811059B2Resistive memory apparatus, layout structure, and sensing circuit thereofRHO KWANG MYOUNG·Filed 2011·Granted Aug 19, 2014·9 cites·11 claims
- 0583US7498844B2Output driver for dynamic random access memoryHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 3, 2009·13 cites·30 claims
- 0681US7053679B2Output driver for controlling slew rate in a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted May 30, 2006·30 cites·18 claims
- 0777US10121537B2Electronic deviceSK HYNIX INC·Filed 2017·Granted Nov 6, 2018·4 cites·19 claims
- 0876US8400824B2Non-volatile memory device and method for controlling the sameRHO KWANG MYOUNG·Filed 2010·Granted Mar 19, 2013·6 cites·26 claims
- 0973US5627095AMethod for fabricating semiconductor devices having bit lines and storage node contactsHYUNDAI ELECTRONICS IND·Filed 1995·Granted May 6, 1997·33 cites·11 claims
- 1072US7746723B2Semiconductor memory device and driving method thereofHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jun 29, 2010·5 cites·11 claims
- 1168US7969212B2Circuit for generating power-up signal of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jun 28, 2011·5 cites·17 claims
- 1264US5693542AMethod for forming a transistor with a trenchHYUNDAI ELECTRONICS IND·Filed 1995·Granted Dec 2, 1997·24 cites·20 claims
- 1363US12438126B2Stacked integrated circuitSK HYNIX INC·Filed 2022·Granted Oct 7, 2025·0 cites·27 claims
- 1463US7489586B2Semiconductor memory device and driving method thereofHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 10, 2009·3 cites·11 claims
- 1562US7154721B2Electrostatic discharge input protection circuitHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Dec 26, 2006·2 cites·10 claims
- 1660US7920417B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Apr 5, 2011·4 cites·15 claims
- 1759USRE44632ESemiconductor memory device and driving method thereofOH YOUNG-HOON·Filed 2012·Granted Dec 10, 2013·1 cites·39 claims
- 1858US5904541AMethod for fabricating a semiconductor device having a shallow trench isolation structureHYUNDAI ELECTRONICS IND·Filed 1997·Granted May 18, 1999·20 cites·14 claims
- 1953US7663399B2Semiconductor memory device having output drive and delay unitHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Feb 16, 2010·2 cites·16 claims
- 2050US8036026B2Semiconductor memory device and method for operating the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Oct 11, 2011·2 cites·10 claims
- 2149USRE48341ESemiconductor memory device and driving method thereofCONVERSANT INTELLECTUAL PROPERTY MAN INC·Filed 2013·Granted Dec 1, 2020·0 cites·20 claims
- 2246US10490274B2Non-volatile semiconductor memory device with improved pre-charging for high speed operationSK HYNIX INC·Filed 2018·Granted Nov 26, 2019·0 cites·14 claims
- 2344US10062436B2Non-volatile semiconductor memory device with improved pre-charging for high speed operationSK HYNIX INC·Filed 2016·Granted Aug 28, 2018·0 cites·20 claims
- 2442US8106689B2Circuit for generating power-up signal of semiconductor memory apparatusRHO KWANG-MYOUNG·Filed 2011·Granted Jan 31, 2012·0 cites·20 claims
- 2542US5527738AMethod for forming contacts in semiconductor devicesHYUNDAI ELECTRONICS IND·Filed 1994·Granted Jun 18, 1996·13 cites·8 claims
- 2641US2009058487A1Delay circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 2741US2007069792A1Delay circuitRHO KWANG-MYOUNG·Filed 2006·Application pending·0 cites
- 2840US7042782B2Bit line sense amplifier for inhibiting increase of offset voltageHYNIX SEMICONDUCTOR INC·Filed 2004·Granted May 9, 2006·2 cites·3 claims
- 2939US7864616B2Bulk voltage detectorHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jan 4, 2011·0 cites·14 claims
- 3039US7728643B2Delay circuit and semiconductor memory device including the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 1, 2010·0 cites·8 claims
- 3139US2008303558A1Data output driver circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 3238US2009160505A1Power-up circuit reducing variation in triggering voltage caused by variation in process or temperature in semiconductor integrated circuitRHO KWANG MYOUNG·Filed 2008·Application pending·0 cites
- 3336US8225417B2Circuit for controlling signal line transmitting data and method of controlling the sameRHO KWANG-MYOUNG·Filed 2008·Granted Jul 17, 2012·0 cites·8 claims
- 3436US7579846B2Offset voltage measuring apparatusHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 25, 2009·0 cites·28 claims
- 3536US2009160540A1Power-up circuit for reducing a variation in triggering voltage in a semiconductor integrated circuitRHO KWANG MYOUNG·Filed 2008·Application pending·0 cites
- 3635US2005073339A1Differential amplifier and bit-line sense amplifier adopting the sameHYNIX SEMICONDUCTOR INC·Filed 2003·Application pending·0 cites
- 3733US9105331B2Semiconductor memory apparatus and method of operating using the sameSK HYINX INC·Filed 2013·Granted Aug 11, 2015·0 cites·19 claims
- 3831US2011205819A1Redundancy data storage circuit, redundancy data control method and repair determination circuit of semiconductor memoryHYNIX SEMICONDUCTOR INC·Filed 2010·Application pending·0 cites
- 3929US2001011759A1Semiconductor device having a shallow trench isolation structure and a method for fabricating the sameFiled 1998·Application pending·0 cites
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