Inventor · disambiguated record
Andrej Rumiantsev
Also filed as: RUMIANTSEV ANDREJ
6 granted patents·9 pending applications·12 citations·filing 2007–2025
75Inventor score
Top patents by PatentIndex Score
15 records- 0175US2025044350A1Method of determining probing parameters for probe system to test device under test, probe system and method of operating the same, non-transitory computer-readable storage media, method of testing unpackaged semiconductor device, tested semiconductor device and method of producing the same, and method of generating virtual mark imageMPI CORP·Filed 2024·Application pending·0 cites
- 0274US2025044346A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0374US2025044349A1Wafer probe station and method for establishing an evaluation model for calibration of a probe assemblyMPI CORP·Filed 2024·Application pending·0 cites
- 0473US8344744B2Probe station for on-wafer-measurement under EMI-shieldingCASCADE MICROTECH INC·Filed 2010·Granted Jan 1, 2013·3 cites·9 claims
- 0567US7999563B2Chuck for supporting and retaining a test substrate and a calibration substrateCASCADE MICROTECH INC·Filed 2009·Granted Aug 16, 2011·5 cites·19 claims
- 0663US2025327862A1Method, system, device, and media related to drift verificationMPI CORP·Filed 2025·Application pending·0 cites
- 0752US7768271B2Method for calibration of a vectorial network analyzer having more than two portsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·8 claims
- 0852US7769555B2Method for calibration of a vectorial network analyzerSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·7 claims
- 0952US2024402238A1Test system and method for data verification for the sameMPI CORP·Filed 2023·Application pending·0 cites
- 1045US2010106439A1Process for measuring the impedance of electronic circuitsSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1143US8680879B2Chuck for supporting and retaining a test substrate and a calibration substrateRUMIANTSEV ANDREJ·Filed 2011·Granted Mar 25, 2014·0 cites·23 claims
- 1242US10048844B2Operating method for inspecting equipmentMPI CORP·Filed 2016·Granted Aug 14, 2018·0 cites·15 claims
- 1342US2008281537A1Process for Measuring the Impedance of Electronic CircuitsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 1439US2009314051A1Method for determination of electrical properties of electronic componets and method for calibration of a measuring unitSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1538US2008195344A1Method for determining measurement errors in scattering parameter measurementsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →