Inventor · disambiguated record
Kyoji Yamashita
Also filed as: YAMASHITA KYOJI
43 granted patents·15 pending applications·878 citations·filing 1988–2013
98Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD24TOSHIBA KK16PANASONIC CORP5YAMASHITA KYOJI5ADVANCED MASK INSPECTION TECH3
Top patents by PatentIndex Score
58 records- 0197US7279727B2Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Oct 9, 2007·124 cites·11 claims
- 0290US6084716AOptical substrate inspection apparatusTOSHIBA KK·Filed 1998·Granted Jul 4, 2000·89 cites·21 claims
- 0387US7562327B2Mask layout design improvement in gate width directionPANASONIC CORP·Filed 2006·Granted Jul 14, 2009·17 cites·12 claims
- 0486US6883160B2Pattern inspection apparatusTOSHIBA KK·Filed 2002·Granted Apr 19, 2005·23 cites·10 claims
- 0586US5841173AMOS semiconductor device with excellent drain currentMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Nov 24, 1998·69 cites·5 claims
- 0684US7655904B2Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereonADVANCED MASK INSPECTION TECH·Filed 2007·Granted Feb 2, 2010·9 cites·19 claims
- 0782US7209584B2Pattern inspection apparatusTOSHIBA KK·Filed 2005·Granted Apr 24, 2007·11 cites·5 claims
- 0881US7476957B2Semiconductor integrated circuitPANASONIC CORP·Filed 2007·Granted Jan 13, 2009·9 cites·11 claims
- 0981US7230435B2Capacitance measurement circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jun 12, 2007·25 cites·8 claims
- 1077US7792663B2Circuit simulation methodPANASONIC CORP·Filed 2007·Granted Sep 7, 2010·9 cites·21 claims
- 1177US5185812AOptical pattern inspection systemTOSHIBA KK·Filed 1991·Granted Feb 9, 1993·92 cites·10 claims
- 1275US7809181B2Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereonADVANCED MASK INSPECTION TECH·Filed 2007·Granted Oct 5, 2010·7 cites·19 claims
- 1375US7126174B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Oct 24, 2006·13 cites·20 claims
- 1475US7032208B2Defect inspection apparatusTOSHIBA KK·Filed 2003·Granted Apr 18, 2006·12 cites·16 claims
- 1574US7551767B2Pattern inspection apparatusTOSHIBA KK·Filed 2008·Granted Jun 23, 2009·5 cites·9 claims
- 1672US7421109B2Pattern inspection apparatusTOSHIBA KK·Filed 2003·Granted Sep 2, 2008·13 cites·9 claims
- 1771US6281562B1Semiconductor device which reduces the minimum distance requirements between active areasMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Aug 28, 2001·28 cites·12 claims
- 1870US8260031B2Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a programYAMASHITA KYOJI·Filed 2008·Granted Sep 4, 2012·6 cites·2 claims
- 1970US6396943B2Defect inspection method and defect inspection apparatusTOSHIBA KK·Filed 1998·Granted May 28, 2002·48 cites·4 claims
- 2069US8013361B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2005·Granted Sep 6, 2011·6 cites·12 claims
- 2169US5404410AMethod and system for generating a bit patternTOSHIBA KK·Filed 1994·Granted Apr 4, 1995·38 cites·5 claims
- 2268US6876208B2Semiconductor device and method of checking semiconductor storage deviceRENESAS TECH CORP·Filed 2002·Granted Apr 5, 2005·13 cites·12 claims
- 2367US7415149B2Pattern inspection apparatusTOSHIBA KK·Filed 2007·Granted Aug 19, 2008·3 cites·7 claims
- 2466US7577288B2Sample inspection apparatus, image alignment method, and program-recorded readable recording mediumADVANCED MASK INSPECTION TECH·Filed 2005·Granted Aug 18, 2009·6 cites·9 claims
- 2566US5100234AMethod and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objectsTOSHIBA KK·Filed 1990·Granted Mar 31, 1992·18 cites·21 claims
- 2665US7519593B2Data searching system, method of synchronizing metadata and data searching apparatusTOSHIBA KK·Filed 2006·Granted Apr 14, 2009·5 cites·13 claims
- 2765US5610430ASemiconductor device having reduced gate overlapping capacitanceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Mar 11, 1997·31 cites·7 claims
- 2861US6492672B1Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 10, 2002·7 cites·11 claims
- 2961US5879983ASemiconductor device and method for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Mar 9, 1999·16 cites·4 claims
- 3060US6205570B1Method for designing LSI circuit patternMATSUSHITA ELECTRONICS CORP·Filed 1998·Granted Mar 20, 2001·38 cites·13 claims
- 3159US8233698B2Pattern inspection apparatus, corrected image generation method, and computer-readable recording medium storing programYAMASHITA KYOJI·Filed 2008·Granted Jul 31, 2012·4 cites·13 claims
- 3258US7709900B2Semiconductor devicePANASONIC CORP·Filed 2007·Granted May 4, 2010·1 cites·10 claims
- 3358US6982555B2Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 3, 2006·8 cites·12 claims
- 3457US7171640B2System and method for operation verification of semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Jan 30, 2007·1 cites·10 claims
- 3557US6124160ASemiconductor device and method for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Sep 26, 2000·13 cites·4 claims
- 3656US6894520B2Semiconductor device and capacitance measurement methodRENESAS TECH CORP·Filed 2003·Granted May 17, 2005·8 cites·11 claims
- 3755US5675168AUnsymmetrical MOS device having a gate insulator area offset from the source and drain areas, and ESD protection circuit including such a MOS deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Oct 7, 1997·16 cites·5 claims
- 3853US6967409B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Nov 22, 2005·3 cites·81 claims
- 3950US4988197AMethod and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objectsTOSHIBA KK·Filed 1988·Granted Jan 29, 1991·8 cites·139 claims
- 4049US6709950B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 23, 2004·2 cites·22 claims
- 4149US2005156220A1Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 4247US5856754ASemiconductor integrated circuit with parallel/serial/parallel conversionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Jan 5, 1999·9 cites·14 claims
- 4343US2006282249A1Circuit simulation method and circuit simulation apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 4443US2006271902A1Semiconductor integrated circuit designing method and library designing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 4543US2014043467A1Defect inspection apparatusTOSHIBA KK·Filed 2013·Application pending·0 cites
- 4642US2008021689A1Method for designing semiconductor integrated circuit and method of circuit simulationYAMASHITA KYOJI·Filed 2007·Application pending·0 cites
- 4742US2008105904A1Method for variability constraints in design of integrated circuits especially digital circuits which includes timing closure upon placement and routing of digital circuit or networkMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 4842US2008072199A1Method for designing semiconductor integrated circuitYAMASHITA KYOJI·Filed 2007·Application pending·0 cites
- 4942US2006010409A1Semiconductor integrated circuit design method, design support system for the same, and delay libraryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 5040US2007111405A1Design method for semiconductor integrated circuitWATANABE SHINJI·Filed 2006·Application pending·0 cites
Showing the top 50 of 58 patent records by PatentIndex Score.
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