Assignee
YAMASHITA KYOJI
JP·2 granted patents·3 pending applications·10 citations·filing 2007–2008
Top patents by PatentIndex Score
5 records- 0170US8260031B2Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a programYAMASHITA KYOJI·Filed 2008·Granted Sep 4, 2012·6 cites·2 claims
- 0259US8233698B2Pattern inspection apparatus, corrected image generation method, and computer-readable recording medium storing programYAMASHITA KYOJI·Filed 2008·Granted Jul 31, 2012·4 cites·13 claims
- 0342US2008021689A1Method for designing semiconductor integrated circuit and method of circuit simulationYAMASHITA KYOJI·Filed 2007·Application pending·0 cites
- 0442US2008072199A1Method for designing semiconductor integrated circuitYAMASHITA KYOJI·Filed 2007·Application pending·0 cites
- 0539US2008283922A1Semiconductor device and manufacturing method thereofYAMASHITA KYOJI·Filed 2008·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →