Inventor · disambiguated record
Sang-Man Byun
Also filed as: BYUN SANG-MAN
9 granted patents·2 pending applications·58 citations·filing 2000–2011
86Inventor score
Top patents by PatentIndex Score
11 records- 0183US7397715B2Semiconductor memory device for testing redundancy cellsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 8, 2008·16 cites·21 claims
- 0273US6269046B1Semiconductor memory device having improved decoders for decoding row and column address signalsSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jul 31, 2001·22 cites·19 claims
- 0368US8477553B2Fuse circuit and semiconductor device having the sameKANG SANG-SEOK·Filed 2011·Granted Jul 2, 2013·2 cites·19 claims
- 0466US7391254B2Circuit and method of generating internal supply voltage in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 24, 2008·6 cites·20 claims
- 0563US7624317B2Parallel bit test circuit and method for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 24, 2009·5 cites·14 claims
- 0660US7466616B2Bit line sense amplifier and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 16, 2008·4 cites·16 claims
- 0750US7433252B2Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 7, 2008·2 cites·12 claims
- 0843US7747912B2Semiconductor memory device capable of arbitrarily setting the number of memory cells to be tested and related test methodSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 29, 2010·1 cites·15 claims
- 0938US2008316846A1Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1035US7483320B2Data input/output method of semiconductor memory device and semiconductor memory device for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 27, 2009·0 cites·12 claims
- 1134US2007058316A1Semiconductor device having fuse circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →