Inventor · disambiguated record
Hidetaka Natsume
Also filed as: NATSUME HIDETAKA
20 granted patents·1 pending application·181 citations·filing 1995–2014
94Inventor score
Top patents by PatentIndex Score
21 records- 0190US6765272B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2002·Granted Jul 20, 2004·60 cites·14 claims
- 0273US8036048B2Semiconductor integrated circuit having DRAM word line driversRENESAS ELECTRONICS CORP·Filed 2008·Granted Oct 11, 2011·5 cites·10 claims
- 0370US6900513B2Semiconductor memory device and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2002·Granted May 31, 2005·10 cites·16 claims
- 0466US5672520AMethod of checking alignment accuracy in photolithographyNEC CORP·Filed 1996·Granted Sep 30, 1997·33 cites·6 claims
- 0565US7214572B2Semiconductor memory device and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2005·Granted May 8, 2007·2 cites·23 claims
- 0661US9099197B2Semiconductor integrated circuit with thick gate oxide word line driving circuitRENESAS ELECTRONICS CORP·Filed 2014·Granted Aug 4, 2015·1 cites·7 claims
- 0761US8797810B2Semiconductor integrated circuit with thick gate oxide word line driving circuitRENESAS ELECTRONICS CORP·Filed 2014·Granted Aug 5, 2014·1 cites·13 claims
- 0861US8699284B2Semiconductor integrated circuit with thick gate oxide word line driving circuitRENESAS ELECTRONICS CORP·Filed 2013·Granted Apr 15, 2014·1 cites·9 claims
- 0960US8391084B2Semiconductor integrated circuitTAKAHASHI HIROYUKI·Filed 2011·Granted Mar 5, 2013·1 cites·7 claims
- 1052US5686736ASRAM cell having thin film transistors as loadsNEC CORP·Filed 1997·Granted Nov 11, 1997·18 cites·13 claims
- 1150US7250661B2Semiconductor memory device with plural source/drain regionsNEC ELECTRONICS CORP·Filed 2004·Granted Jul 31, 2007·4 cites·12 claims
- 1250US6495899B2Semiconductor device capable of surely fixing voltage at wellNEC CORP·Filed 2001·Granted Dec 17, 2002·9 cites·6 claims
- 1349US6031291ACommon contact hole structure in semiconductor deviceNEC CORP·Filed 1995·Granted Feb 29, 2000·17 cites·6 claims
- 1444US8357612B2Method for manufacturing semiconductor device and semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Jan 22, 2013·0 cites·18 claims
- 1538US5757031ASemiconductor static memory device having a TFT loadNEC CORP·Filed 1996·Granted May 26, 1998·7 cites·17 claims
- 1636US7660085B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2006·Granted Feb 9, 2010·0 cites·11 claims
- 1736US5761113ASoft error suppressing resistance load type SRAM cellNEC CORP·Filed 1995·Granted Jun 2, 1998·6 cites·12 claims
- 1833US6207539B1Semiconductor device having field isolating film of which upper surface is flat and method thereofNEC CORP·Filed 1998·Granted Mar 27, 2001·4 cites·4 claims
- 1930US5770495AMethod of fabricating semiconductor device including high temperature heat treatmentNEC CORP·Filed 1995·Granted Jun 23, 1998·2 cites·20 claims
- 2029US6333542B2Semiconductor device and method of manufacturing the sameNEC CORP·Filed 1999·Granted Dec 25, 2001·0 cites·21 claims
- 2129US2001040260A1High-resistance load sramFiled 1998·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →