Inventor · disambiguated record
Qiang Zhang
Also filed as: ZHANG QIANG · ZHANG QIANG Q
21 granted patents·4 pending applications·167 citations·filing 2001–2023
94Inventor score
Files withKLA TENCOR CORP10UNIV OXFORD INNOVATION LTD2BEIJING JINGDONG QIANSHI TECH CO LTD1CAI WEI JIA1CHEN LU1
Top patents by PatentIndex Score
25 records- 0195US11356594B1Tilted slit confocal system configured for automated focus detection and trackingKLA CORP·Filed 2020·Granted Jun 7, 2022·9 cites·35 claims
- 0293US10697900B2Correlating SEM and optical images for wafer noise nuisance identificationKLA TENCOR CORP·Filed 2019·Granted Jun 30, 2020·6 cites·18 claims
- 0393US8605275B2Detecting defects on a waferCHEN LU·Filed 2011·Granted Dec 10, 2013·22 cites·20 claims
- 0492US10634623B2Phase contrast monitoring for extreme ultra-violet (EUV) masks defect inspectionKLA TENCOR CORP·Filed 2017·Granted Apr 28, 2020·5 cites·24 claims
- 0591US9335206B2Wave front aberration metrology of optics of EUV mask inspection systemKLA TENCOR CORP·Filed 2013·Granted May 10, 2016·8 cites·25 claims
- 0691US8963110B2Continuous generation of extreme ultraviolet lightKLA TENCOR CORP·Filed 2014·Granted Feb 24, 2015·12 cites·30 claims
- 0790US8245135B2Producing a visual summarization of text documentsCAI WEI JIA·Filed 2009·Granted Aug 14, 2012·67 cites·19 claims
- 0886US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 0984US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 1083US10761031B1Arbitrary wavefront compensator for deep ultraviolet (DUV) optical imaging systemKLA TENCOR CORP·Filed 2018·Granted Sep 1, 2020·2 cites·22 claims
- 1180US8666934B2System and method for managing activities in project managementCUI JIE·Filed 2007·Granted Mar 4, 2014·7 cites·12 claims
- 1271US8148677B2Peptide identification and quantitation by merging MS/MS spectraZHANG QIANG·Filed 2008·Granted Apr 3, 2012·5 cites·22 claims
- 1368US8996984B2Automatic visual preview of non-visual dataKISSA PETER·Filed 2010·Granted Mar 31, 2015·2 cites·20 claims
- 1468US8935276B2Apparatus for and method of handling data analysisLI SHAO CHUN·Filed 2011·Granted Jan 13, 2015·1 cites·14 claims
- 1566US7835780B1MR invasive device and method for active MR guidance of invasive devices with target navigationDUERK JEFFREY L·Filed 2001·Granted Nov 16, 2010·13 cites·24 claims
- 1662US10921262B2Correlating SEM and optical images for wafer noise nuisance identificationKLA TENCOR CORP·Filed 2020·Granted Feb 16, 2021·0 cites·18 claims
- 1752US11448654B2Protein-protein interaction assessed by detecting localized coiled coil subunitsUNIV CALIFORNIA·Filed 2018·Granted Sep 20, 2022·0 cites·20 claims
- 1849US11945542B1Express tricycle target objectCHINA AUTOMOTIVE ENG RES INST·Filed 2023·Granted Apr 2, 2024·0 cites·4 claims
- 1949US2006168550A1System, method and apparatus for creating and managing activities in a collaborative computing environmentIBM·Filed 2005·Application pending·0 cites
- 2044US2019052745A1Method For Presenting An Interface Of A Remote Controller In A Mobile DeviceHISENSE MOBILE COMMUNICATIONS TECH CO LTD·Filed 2018·Application pending·0 cites
- 2143US2023312246A1Shuttle vehicleBEIJING JINGDONG QIANSHI TECH CO LTD·Filed 2021·Application pending·0 cites
- 2243US2014168758A1Carbon as grazing incidence euv mirror and spectral purity filterKLA TENCOR CORP·Filed 2013·Application pending·0 cites
- 2341US12499524B2Enhancement of medical imagesUNIV OXFORD INNOVATION LTD·Filed 2020·Granted Dec 16, 2025·0 cites·18 claims
- 2441US11410830B1Defect inspection and review using transmissive current image of charged particle beam systemKLA TENCOR CORP·Filed 2019·Granted Aug 9, 2022·0 cites·17 claims
- 2538US11747426B2Validation of quantitative magnetic resonance imaging protocolsUNIV OXFORD INNOVATION LTD·Filed 2020·Granted Sep 5, 2023·0 cites·16 claims
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