Inventor · disambiguated record
Shih-Fang Hong
Also filed as: HONG SHIH-FANG
27 granted patents·2 pending applications·130 citations·filing 1999–2020
95Inventor score
Top patents by PatentIndex Score
29 records- 0196US8802521B1Semiconductor fin-shaped structure and manufacturing process thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Aug 12, 2014·22 cites·16 claims
- 0294US9704737B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 11, 2017·10 cites·6 claims
- 0394US9559164B2Nanowire transistor device and method for manufacturing nanowire transistor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·9 cites·10 claims
- 0491US9455194B1Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·7 cites·6 claims
- 0591US9123810B2Semiconductor integrated device including FinFET device and protecting structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 1, 2015·11 cites·19 claims
- 0685US9653290B2Method for manufacturing nanowire transistor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 16, 2017·3 cites·10 claims
- 0781US9881831B2Method for fabricating semiconductor device including fin shaped structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 30, 2018·2 cites·10 claims
- 0881US9385048B2Method of forming Fin-FETUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 5, 2016·6 cites·12 claims
- 0981US9384978B1Method of forming trenchesUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 5, 2016·3 cites·19 claims
- 1081US9349695B2Semiconductor integrated device including FinFET device and protecting structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 24, 2016·3 cites·4 claims
- 1180US9722078B2Semiconductor device including fin shaped structure and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 1, 2017·2 cites·11 claims
- 1279US9000483B2Semiconductor device with fin structure and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 7, 2015·4 cites·18 claims
- 1373US9208276B1Method for generating layout patternUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 8, 2015·1 cites·9 claims
- 1472US11387148B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jul 12, 2022·0 cites·10 claims
- 1572US9373719B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 21, 2016·3 cites·12 claims
- 1671US8569127B2Semiconductor device and method for fabricating the sameCHEN CHIEN-YANG·Filed 2012·Granted Oct 29, 2013·3 cites·12 claims
- 1766US6255172B1Electrically erasable non-volatile memoryUNITED MICROELECTRONICS CORP·Filed 2000·Granted Jul 3, 2001·16 cites·11 claims
- 1864US10692777B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 23, 2020·0 cites·6 claims
- 1959US10068808B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 4, 2018·0 cites·8 claims
- 2056US9954108B2Semiconductor device including fin shaped structure including silicon germanium layerUNITED MICROELECTRONICS CORP·Filed 2017·Granted Apr 24, 2018·0 cites·4 claims
- 2156US9502252B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 22, 2016·0 cites·8 claims
- 2255US9141744B2Method for generating layout patternUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 22, 2015·0 cites·9 claims
- 2354US9859148B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 2, 2018·0 cites·9 claims
- 2454US6177362B1Fabrication method for gate structure having gate dielectric layers of different thicknessUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jan 23, 2001·15 cites·13 claims
- 2551US9190497B2Method for fabricating semiconductor device with loop-shaped finUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 17, 2015·0 cites·16 claims
- 2650US6228718B1Method of fabricating a self-aligned split gate of a flash memoryUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 8, 2001·10 cites·20 claims
- 2747US2022076146A1Yield rate prediction method, yield rate prediction system and model training device of semiconductor manufacturing processUNITED MICROELECTRONICS CORP·Filed 2020·Application pending·0 cites
- 2840US9530646B2Method of forming a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·0 cites·18 claims
- 2937US2009224327A1Plane mos and the method for making the sameLIOU EN-CHIUAN·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →