Inventor · disambiguated record
Benjamin Lee Amey
Also filed as: AMEY BENJAMIN · AMEY BENJAMIN L · AMEY BENJAMIN LEE
9 granted patents·46 citations·filing 2002–2023
84Inventor score
Top patents by PatentIndex Score
9 records- 0189US11624769B2High-side gate over-voltage stress testingTEXAS INSTRUMENTS INC·Filed 2022·Granted Apr 11, 2023·1 cites·19 claims
- 0279US7554309B2Circuits, devices and methods for regulator minimum load controlTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 30, 2009·12 cites·8 claims
- 0375US6747498B1CAN receiver wake-up circuitTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 8, 2004·22 cites·16 claims
- 0469US11353494B2High-side gate over-voltage stress testingTEXAS INSTRUMENTS INC·Filed 2020·Granted Jun 7, 2022·0 cites·15 claims
- 0566US12395165B2Apparatus and methods to control well bias in a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2023·Granted Aug 19, 2025·0 cites·22 claims
- 0666US8674352B2Overvoltage testing apparatusSOUNDARAPANDIAN KANNAN·Filed 2012·Granted Mar 18, 2014·4 cites·21 claims
- 0759US10613134B2High-side gate over-voltage stress testingTEXAS INSTRUMENTS INC·Filed 2016·Granted Apr 7, 2020·0 cites·6 claims
- 0858US7301746B2Thermal shutdown trip point modification during current limitTEXAS INSTRUMENTS INC·Filed 2005·Granted Nov 27, 2007·3 cites·6 claims
- 0955US8022686B2Reference circuit with reduced current startupTEXAS INSTRUMENTS INC·Filed 2009·Granted Sep 20, 2011·4 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →