Inventor · disambiguated record
Arnold A. Weiss
Also filed as: WEISS ARNOLD · WEISS ARNOLD A
16 granted patents·792 citations·filing 1976–2003
96Inventor score
Top patents by PatentIndex Score
16 records- 0196US4504964ALaser beam plasma pinch X-ray systemEATON CORP·Filed 1982·Granted Mar 12, 1985·145 cites·20 claims
- 0295US4536884APlasma pinch X-ray apparatusEATON CORP·Filed 1982·Granted Aug 20, 1985·99 cites·23 claims
- 0394US4633492APlasma pinch X-ray methodEATON CORP·Filed 1984·Granted Dec 30, 1986·88 cites·8 claims
- 0494US4618971AX-ray lithography systemEATON CORP·Filed 1984·Granted Oct 21, 1986·89 cites·14 claims
- 0588US6907777B2Apparatus and method for electronic tire testingFiled 2003·Granted Jun 21, 2005·34 cites·34 claims
- 0687US4821205ASeismic isolation system with reaction massEATON CORP·Filed 1986·Granted Apr 11, 1989·64 cites·18 claims
- 0786US6600326B2Voltage applicator for tire inspection and methodFiled 2001·Granted Jul 29, 2003·24 cites·25 claims
- 0884US4520307AHigh-voltage tire testing apparatusWEISS ARNOLD A·Filed 1984·Granted May 28, 1985·57 cites·23 claims
- 0983US4297876AUltrasonic tire testing apparatusAMF INC·Filed 1979·Granted Nov 3, 1981·35 cites·4 claims
- 1082US6832513B2Apparatus and method for tire testingWEISS ARNOLD A·Filed 2003·Granted Dec 21, 2004·25 cites·14 claims
- 1179US4327579AUltrasonic tire testing apparatusAMF INC·Filed 1981·Granted May 4, 1982·35 cites·3 claims
- 1271US6304090B1High voltage tire testing apparatusFiled 1999·Granted Oct 16, 2001·25 cites·46 claims
- 1371US4274289ATransducer positioning system for ultrasonic tire testing apparatusAMF INC·Filed 1979·Granted Jun 23, 1981·26 cites·7 claims
- 1468US6837102B2Method and apparatus for tire flaw detectionFiled 2003·Granted Jan 4, 2005·12 cites·17 claims
- 1564US4337660AUltrasonic tire testing apparatusAMF INC·Filed 1981·Granted Jul 6, 1982·20 cites·7 claims
- 1655US4011751ABrake testerAPPLIED POWER INC·Filed 1976·Granted Mar 15, 1977·14 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →