Inventor · disambiguated record
Kenneth Wilsher
Also filed as: WILSHER KENNETH · WILSHER KENNETH R
18 granted patents·2 pending applications·568 citations·filing 1992–2006
96Inventor score
Files withCREDENCE SYSTEMS CORP7DCG SYSTEMS INC3SCHLUMBERGER TECHNOLOGIES INC3SCHLUMBERGER TECHNOLOGIES2NPTEST INC1
Top patents by PatentIndex Score
20 records- 0196US7042563B2Optical coupling for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 9, 2006·35 cites·12 claims
- 0293US7450245B2Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing systemDCG SYSTEMS INC·Filed 2006·Granted Nov 11, 2008·26 cites·32 claims
- 0392US7659981B2Apparatus and method for probing integrated circuits using polarization difference probingDCG SYSTEMS INC·Filed 2005·Granted Feb 9, 2010·36 cites·30 claims
- 0491US6812464B1Superconducting single photon detectorCREDENCE SYSTEMS CORP·Filed 2000·Granted Nov 2, 2004·101 cites·4 claims
- 0590US6501288B1On-chip optically triggered latch for IC time measurementsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 31, 2002·47 cites·16 claims
- 0685US5905577ADual-laser voltage probing of IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted May 18, 1999·59 cites·30 claims
- 0785US5270643APulsed laser photoemission electron-beam probeSCHLUMBERGER TECHNOLOGIES·Filed 1992·Granted Dec 14, 1993·68 cites·36 claims
- 0883US6967491B2Spatial and temporal selective laser assisted fault localizationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 22, 2005·32 cites·48 claims
- 0983US6496261B1Double-pulsed optical interferometer for waveform probing of integrated circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 17, 2002·29 cites·37 claims
- 1082US7049593B2Superconducting single photon detectorUNIV ROCHESTER·Filed 2004·Granted May 23, 2006·33 cites·34 claims
- 1180US7616312B2Apparatus and method for probing integrated circuits using laser illuminationDCG SYSTEMS INC·Filed 2005·Granted Nov 10, 2009·12 cites·55 claims
- 1278US6985219B2Optical coupling for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2000·Granted Jan 10, 2006·18 cites·2 claims
- 1377US6819117B2PICA system timing measurement & calibrationCREDENCE SYSTEMS CORP·Filed 2002·Granted Nov 16, 2004·18 cites·6 claims
- 1469US6781218B1Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrateNPTEST INC·Filed 2003·Granted Aug 24, 2004·16 cites·22 claims
- 1560US6905623B2Precise, in-situ endpoint detection for charged particle beam processingCREDENCE SYSTEMS CORP·Filed 2002·Granted Jun 14, 2005·3 cites·18 claims
- 1655US5287022AMethod and circuit for controlling voltage reflections on transmission linesSCHLUMBERGER TECHNOLOGIES·Filed 1993·Granted Feb 15, 1994·31 cites·13 claims
- 1751US7228464B2PICA system timing measurement and calibrationCREDENCE SYSTEMS CORP·Filed 2004·Granted Jun 5, 2007·4 cites·10 claims
- 1846US2005109956A1Precise, in-situ endpoint detection for charged particle beam processingFiled 2004·Application pending·0 cites
- 1936US2002074494A1Precise, in-situ endpoint detection for charged particle beam processingFiled 2000·Application pending·0 cites
- 2035US6737853B2Photoconductive-sampling voltage measurementNPTEST LLC·Filed 2001·Granted May 18, 2004·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →