Inventor · disambiguated record
Hiroshi Amemiya
Also filed as: AMEMIYA HIROSHI
12 granted patents·184 citations·filing 1974–2021
92Inventor score
Top patents by PatentIndex Score
12 records- 0181US7385386B2Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and proberTOKYO ELECTRON LTD·Filed 2005·Granted Jun 10, 2008·6 cites·7 claims
- 0280US6762616B2Probe systemTOKYO ELECTRON LTD·Filed 2002·Granted Jul 13, 2004·26 cites·6 claims
- 0377US6169409B1Low-temperature wafer testing method and proberTOKYO ELECTRON LTD·Filed 1998·Granted Jan 2, 2001·43 cites·7 claims
- 0475US4063236AAnalog-digital converterTOKYO SHIBAURA ELECTRIC CO·Filed 1975·Granted Dec 13, 1977·23 cites·7 claims
- 0574US3973130AApparatus for recording information on a filmTOKYO SHIBAURA ELECTRIC CO·Filed 1974·Granted Aug 3, 1976·9 cites·7 claims
- 0665US6958618B2Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and proberTOKYO ELECTRON LTD·Filed 2003·Granted Oct 25, 2005·8 cites·8 claims
- 0765US6249132B1Inspection methods and apparatusesTOKYO ELECTRON LTD·Filed 1998·Granted Jun 19, 2001·27 cites·14 claims
- 0860US12106997B2Test device, change kit, and method of exchanging change kitTOKYO ELECTRON LTD·Filed 2021·Granted Oct 1, 2024·0 cites·8 claims
- 0958US4125023ATemperature-measuring apparatusTOKYO SHIBAURA ELECTRIC CO·Filed 1976·Granted Nov 14, 1978·17 cites·16 claims
- 1056US4081800AAnalog-to-digital converterTOKYO SHIBAURA ELECTRIC CO·Filed 1975·Granted Mar 28, 1978·11 cites·11 claims
- 1154US5031125AApparatus for measuring electron temperatureRIKAGAKU KENKYUSHO·Filed 1989·Granted Jul 9, 1991·8 cites·3 claims
- 1237US4922205AApparatus for detecting contamination on probe surfaceRIKAGAKU KENKYUSHO·Filed 1989·Granted May 1, 1990·6 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →