Inventor · disambiguated record
Hyun Mo Cho
Also filed as: CHO HYUN M · CHO HYUN MO
17 granted patents·3 pending applications·46 citations·filing 2004–2024
91Inventor score
Files withKOREA RES INST STANDARDS & SCI9KOREA RES INST OF STANDARDS4CHO HYUN MO3CHO YONG JAI3KOREA RES INSTITUTE OF STANDARD AND SCIENCE1
Top patents by PatentIndex Score
20 records- 0187US9581498B2Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the sameKOREA RES INST STANDARDS & SCI·Filed 2015·Granted Feb 28, 2017·4 cites·9 claims
- 0281US10921241B2Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement methodKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Feb 16, 2021·2 cites·12 claims
- 0378US11493433B2Normal incidence ellipsometer and method for measuring optical properties of sample by using sameKOREA RES INST STANDARDS & SCI·Filed 2019·Granted Nov 8, 2022·2 cites·21 claims
- 0478US8009292B2Single polarizer focused-beam ellipsometerKOREA RES INST OF STANDARDS·Filed 2008·Granted Aug 30, 2011·8 cites·12 claims
- 0574US10317334B2Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the sameKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Jun 11, 2019·2 cites·10 claims
- 0674US8447546B2Measurement of Fourier coefficients using integrating photometric detectorCHO YONG JAI·Filed 2010·Granted May 21, 2013·4 cites·2 claims
- 0773US8830463B2Rotating-element ellipsometer and method for measuring properties of the sample using the sameCHO YONG JAI·Filed 2012·Granted Sep 9, 2014·5 cites·13 claims
- 0871US8940538B2Apparatus and method for quantifying binding and dissociation kinetics of molecular interactionsCHO HYUN MO·Filed 2010·Granted Jan 27, 2015·5 cites·17 claims
- 0971US8004677B2Focused-beam ellipsometerKOREA RES INST OF STANDARDS·Filed 2007·Granted Aug 23, 2011·5 cites·4 claims
- 1070US8705039B2Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometerCHO HYUN MO·Filed 2009·Granted Apr 22, 2014·3 cites·10 claims
- 1168US10145785B2Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the sameKOREA RES INST STANDARDS & SCI·Filed 2014·Granted Dec 4, 2018·1 cites·12 claims
- 1268US2024337591A1Split prism silicon-based liquid immersion microchannel measuring device and methodKOREA RES INST STANDARDS & SCI·Filed 2024·Application pending·0 cites
- 1366US8300221B2Minute measuring instrument for high speed and large area and method thereofCHO YONG JAI·Filed 2008·Granted Oct 30, 2012·4 cites·9 claims
- 1462US8705033B2Multi-channel surface plasmon resonance sensor using beam profile ellipsometryCHO HYUN MO·Filed 2009·Granted Apr 22, 2014·1 cites·5 claims
- 1557US11402321B2High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement methodKOREA RES INSTITUTE OF STANDARD AND SCIENCE·Filed 2019·Granted Aug 2, 2022·0 cites·11 claims
- 1653US12152982B2Device and method for multi-reflection solution immersed silicon-based microchannel measurementKOREA RES INST STANDARDS & SCI·Filed 2020·Granted Nov 26, 2024·0 cites·11 claims
- 1748US10458901B2Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solutionKOREA RES INST STANDARDS & SCI·Filed 2013·Granted Oct 29, 2019·0 cites·18 claims
- 1848US2014313511A1Rotating-element ellipsometer and method for measuring properties of the sample using the sameKOREA RES INST OF STANDARDS·Filed 2014·Application pending·0 cites
- 1945US11719624B2Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type siliconKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Aug 8, 2023·0 cites·18 claims
- 2039US2005157295A1Ellipsometry system and method using spectral imagingKOREA RES INST OF STANDARDS·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →