Inventor · disambiguated record
Leonard Hayden
Also filed as: HAYDEN LEONARD · HAYDEN LEONARD A
34 granted patents·3 pending applications·984 citations·filing 1988–2019
98Inventor score
Top patents by PatentIndex Score
37 records- 0198US6842024B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2003·Granted Jan 11, 2005·84 cites·3 claims
- 0298US6806724B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2003·Granted Oct 19, 2004·104 cites·8 claims
- 0398US6724205B1Probe for combined signalsCASCADE MICROTECH INC·Filed 2002·Granted Apr 20, 2004·110 cites·12 claims
- 0497US7626379B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2007·Granted Dec 1, 2009·39 cites·15 claims
- 0597US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0696US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0796US6362636B1Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Mar 26, 2002·58 cites·1 claims
- 0895US6639415B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2002·Granted Oct 28, 2003·52 cites·3 claims
- 0995US6489789B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Dec 3, 2002·53 cites·1 claims
- 1094US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 1193US7453276B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2007·Granted Nov 18, 2008·16 cites·10 claims
- 1293US7233160B2Wafer probeCASCADE MICROTECH INC·Filed 2001·Granted Jun 19, 2007·39 cites·9 claims
- 1393US6002263AProbe station having inner and outer shieldingCASCADE MICROTECH INC·Filed 1997·Granted Dec 14, 1999·69 cites·13 claims
- 1492US7417446B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2007·Granted Aug 26, 2008·13 cites·6 claims
- 1591US6288557B1Probe station having inner and outer shieldingCASCADE MICROTECH INC·Filed 1999·Granted Sep 11, 2001·54 cites·5 claims
- 1690US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 1790US7285969B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2007·Granted Oct 23, 2007·11 cites·24 claims
- 1889US7688097B2Wafer probeCASCADE MICROTECH INC·Filed 2007·Granted Mar 30, 2010·12 cites·7 claims
- 1989US7456646B2Wafer probeCASCADE MICROTECH INC·Filed 2007·Granted Nov 25, 2008·11 cites·13 claims
- 2088US7761983B2Method of assembling a wafer probeCASCADE MICROTECH INC·Filed 2007·Granted Jul 27, 2010·10 cites·7 claims
- 2188US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 2287US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 2386US7495461B2Wafer probeCASCADE MICROTECH INC·Filed 2007·Granted Feb 24, 2009·9 cites·9 claims
- 2486US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 2581US7190181B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2004·Granted Mar 13, 2007·13 cites·3 claims
- 2679US7205784B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2006·Granted Apr 17, 2007·5 cites·3 claims
- 2776US7250752B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2006·Granted Jul 31, 2007·4 cites·3 claims
- 2876US7075320B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2005·Granted Jul 11, 2006·4 cites·4 claims
- 2973US7436170B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·3 cites·4 claims
- 3065US7908107B2Line-reflect-reflect match calibrationCASCADE MICROTECH INC·Filed 2007·Granted Mar 15, 2011·3 cites·6 claims
- 3161US7352258B2Waveguide adapter for probe assembly having a detachable bias teeCASCADE MICROTECH INC·Filed 2002·Granted Apr 1, 2008·5 cites·14 claims
- 3251US2010251545A1Wafer probeCASCADE MICROTECH INC·Filed 2010·Application pending·0 cites
- 3350US11282923B2Bipolar transistorQORVO US INC·Filed 2019·Granted Mar 22, 2022·0 cites·20 claims
- 3449US2011178752A1Line-reflect-reflect match calibrationCASCADE MICROTECH INC·Filed 2011·Application pending·0 cites
- 3546US7046023B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2004·Granted May 16, 2006·1 cites·8 claims
- 3640US2007294047A1Calibration systemHAYDEN LEONARD·Filed 2006·Application pending·0 cites
- 3730US4827227AStep transition time reduction for filtered oscillatorsTEKTRONIX INC·Filed 1988·Granted May 2, 1989·1 cites·7 claims
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