Inventor · disambiguated record
Ping-Chuan Wang
Also filed as: WANG PING · WANG PING-CHUAN
204 granted patents·26 pending applications·1,442 citations·filing 1991–2023
99Inventor score
Top patents by PatentIndex Score
230 records- 0198US9435852B1Integrated circuit (IC) test structure with monitor chain and test wiresGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 6, 2016·64 cites·20 claims
- 0297US6383920B1Process of enclosing via for improved reliability in dual damascene interconnectsIBM·Filed 2001·Granted May 7, 2002·179 cites·27 claims
- 0396US8525549B1Physical unclonable function cell and arrayFENG KAI D·Filed 2012·Granted Sep 3, 2013·32 cites·20 claims
- 0496US8304863B2Electromigration immune through-substrate viasFILIPPI RONALD G·Filed 2010·Granted Nov 6, 2012·38 cites·8 claims
- 0596US7863960B2Three-dimensional chip-stack synchronizationIBM·Filed 2009·Granted Jan 4, 2011·38 cites·26 claims
- 0695US8237278B2Configurable interposerGLUSCHENKOV OLEG·Filed 2009·Granted Aug 7, 2012·29 cites·11 claims
- 0795US7893529B2Thermoelectric 3D coolingIBM·Filed 2009·Granted Feb 22, 2011·34 cites·12 claims
- 0894US9391030B1On-chip semiconductor device having enhanced variabilityIBM·Filed 2015·Granted Jul 12, 2016·9 cites·10 claims
- 0994US8633707B2Stacked via structure for metal fuse applicationsFILIPPI RONALD G·Filed 2011·Granted Jan 21, 2014·15 cites·17 claims
- 1093US9768065B1Interconnect structures with variable dopant levelsGLOBALFOUNDRIES INC·Filed 2016·Granted Sep 19, 2017·10 cites·13 claims
- 1193US9576914B2Inducing device variation for security applicationsGLOBALFOUNDRIES INC·Filed 2015·Granted Feb 21, 2017·10 cites·10 claims
- 1293US8232646B2Interconnect structure for integrated circuits having enhanced electromigration resistanceBONILLA GRISELDA·Filed 2010·Granted Jul 31, 2012·17 cites·15 claims
- 1393US8211756B23D chip-stack with fuse-type through silicon viaFENG KAI DI·Filed 2010·Granted Jul 3, 2012·15 cites·11 claims
- 1493US7745282B2Interconnect structure with bi-layer metal capIBM·Filed 2007·Granted Jun 29, 2010·26 cites·10 claims
- 1593US7569475B2Interconnect structure having enhanced electromigration reliability and a method of fabricating sameIBM·Filed 2006·Granted Aug 4, 2009·25 cites·1 claims
- 1692US8299567B2Structure of metal e-fuseWANG PING-CHUAN·Filed 2010·Granted Oct 30, 2012·17 cites·16 claims
- 1792US8030113B2Thermoelectric 3D coolingIBM·Filed 2011·Granted Oct 4, 2011·12 cites·6 claims
- 1891US10205054B2III-nitride nanowire LED with strain modified surface active region and method of making thereofGLO AB·Filed 2018·Granted Feb 12, 2019·6 cites·20 claims
- 1991US9882086B2III-nitride nanowire LED with strain modified surface active region and method of making thereofGLO AB·Filed 2015·Granted Jan 30, 2018·7 cites·20 claims
- 2091US9059170B2Electronic fuse having a damaged regionIBM·Filed 2013·Granted Jun 16, 2015·12 cites·24 claims
- 2190US8685817B1Metal gate structures for CMOS transistor devices having reduced parasitic capacitanceIBM·Filed 2012·Granted Apr 1, 2014·10 cites·11 claims
- 2289US7723824B2Methodology for recovery of hot carrier induced degradation in bipolar devicesIBM·Filed 2007·Granted May 25, 2010·16 cites·15 claims
- 2389US7139749B2Method, system, and program for performance tuning a database queryIBM·Filed 2003·Granted Nov 21, 2006·88 cites·27 claims
- 2488US9305879B2E-fuse with hybrid metallizationIBM·Filed 2013·Granted Apr 5, 2016·9 cites·19 claims
- 2588US9240406B2Precision trench capacitorGLOBALFOUNDRIES INC·Filed 2014·Granted Jan 19, 2016·9 cites·20 claims
- 2688US8815669B2Metal gate structures for CMOS transistor devices having reduced parasitic capacitanceIBM·Filed 2013·Granted Aug 26, 2014·8 cites·5 claims
- 2788US8349723B2Structure of power grid for semiconductor devices and method of making the sameIBM·Filed 2012·Granted Jan 8, 2013·8 cites·19 claims
- 2888US7671444B2Empty vias for electromigration during electronic-fuse re-programmingIBM·Filed 2007·Granted Mar 2, 2010·16 cites·6 claims
- 2987US9189654B2On-chip structure for security applicationIBM·Filed 2013·Granted Nov 17, 2015·9 cites·17 claims
- 3087US8493075B2Method and apparatus for preventing circuit failureFENG KAI D·Filed 2010·Granted Jul 23, 2013·9 cites·25 claims
- 3187US8159040B2Metal gate integration structure and method including metal fuse, anti-fuse and/or resistorCOOLBAUGH DOUGLAS D·Filed 2008·Granted Apr 17, 2012·15 cites·21 claims
- 3287US7904273B2In-line depth measurement for thru silicon viaIBM·Filed 2009·Granted Mar 8, 2011·11 cites·20 claims
- 3387US7839163B2Programmable through silicon viaIBM·Filed 2009·Granted Nov 23, 2010·12 cites·8 claims
- 3486US9891261B2Electromigration monitorIBM·Filed 2014·Granted Feb 13, 2018·6 cites·10 claims
- 3586US8232115B2Test structure for determination of TSV depthDING HANYI·Filed 2009·Granted Jul 31, 2012·11 cites·11 claims
- 3686US7930664B2Programmable through silicon viaIBM·Filed 2010·Granted Apr 19, 2011·7 cites·10 claims
- 3786US7911263B2Leakage current mitigation in a semiconductor deviceIBM·Filed 2009·Granted Mar 22, 2011·14 cites·19 claims
- 3886US7710141B2Method and apparatus for dynamic characterization of reliability wearout mechanismsIBM·Filed 2008·Granted May 4, 2010·14 cites·19 claims
- 3985US8138083B2Interconnect structure having enhanced electromigration reliability and a method of fabricating sameYANG CHIH-CHAO·Filed 2009·Granted Mar 20, 2012·10 cites·25 claims
- 4085US7790599B2Metal cap for interconnect structuresIBM·Filed 2007·Granted Sep 7, 2010·13 cites·13 claims
- 4184US8164190B2Structure of power grid for semiconductor devices and method of making the sameFILIPPI RONALD·Filed 2009·Granted Apr 24, 2012·11 cites·14 claims
- 4284US8138603B2Redundancy design with electro-migration immunityHSU LOUIS L·Filed 2008·Granted Mar 20, 2012·9 cites·25 claims
- 4383US9524930B2Configurable interposerIBM·Filed 2014·Granted Dec 20, 2016·4 cites·11 claims
- 4483US8889491B2Method of forming electronic fuse line with modified capIBM·Filed 2013·Granted Nov 18, 2014·5 cites·8 claims
- 4583US7856332B2Real time system for monitoring the commonality, sensitivity, and repeatability of test probesIBM·Filed 2007·Granted Dec 21, 2010·13 cites·22 claims
- 4683US7545161B2Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodesIBM·Filed 2007·Granted Jun 9, 2009·11 cites·14 claims
- 4782US9117824B2Embedded on-chip securityIBM·Filed 2013·Granted Aug 25, 2015·5 cites·5 claims
- 4882US9105637B2Anti-fuse structure and fabricationFILIPPI RONALD G·Filed 2012·Granted Aug 11, 2015·6 cites·10 claims
- 4982US8420537B2Stress locking layer for reliable metallizationCHANDA KAUSHIK·Filed 2008·Granted Apr 16, 2013·11 cites·11 claims
- 5082US8274301B2On-chip accelerated failure indicatorFENG KAI D·Filed 2009·Granted Sep 25, 2012·11 cites·20 claims
Showing the top 50 of 230 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →