Inventor · disambiguated record
Ying-Yen Chen
Also filed as: CHEN YING · CHEN YING-YEN
25 granted patents·11 pending applications·20 citations·filing 2002–2024
92Inventor score
Files withREALTEK SEMICONDUCTOR CORP25CHEN YING-YEN3BEIJING BOE OPTOELECTRONICS TECH CO LTD1BEKAERT SA NV1CHEN YING1
Top patents by PatentIndex Score
36 records- 0187US9157957B1PLL status detection circuit and method thereofREALTEK SEMICONDUCTOR CORP·Filed 2015·Granted Oct 13, 2015·5 cites·21 claims
- 0283US10763836B2Measuring circuit for quantizing variations in circuit operating speedREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Sep 1, 2020·2 cites·20 claims
- 0383US10686433B1Circuit operating speed detecting circuitREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jun 16, 2020·2 cites·20 claims
- 0483US10605861B2Test device for testing integrated circuitREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Mar 31, 2020·2 cites·20 claims
- 0577US10416233B2Electronic apparatus and control method thereofREALTEK SEMICONDUCTOR CORP·Filed 2017·Granted Sep 17, 2019·2 cites·20 claims
- 0675US11073558B2Circuit having multiple scan modes for testingREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jul 27, 2021·2 cites·9 claims
- 0765US12320849B2Clock control circuit and methodREALTEK SEMICONDUCTOR CORP·Filed 2024·Granted Jun 3, 2025·0 cites·20 claims
- 0865US2025334824A1Myopia control contact lensVISCO VISION INC·Filed 2024·Application pending·0 cites
- 0963US12510595B2Scan clock gating controller and method for performing stuck-at fault test among multiple block circuitsREALTEK SEMICONDUCTOR CORP·Filed 2024·Granted Dec 30, 2025·0 cites·12 claims
- 1062US8907709B1Delay difference detection and adjustment device and methodREALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Dec 9, 2014·2 cites·10 claims
- 1162US8901917B2Element measurement circuit and method thereofCHEN YING-YEN·Filed 2012·Granted Dec 2, 2014·2 cites·15 claims
- 1256US11061073B2Circuit testing system and circuit testing methodREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jul 13, 2021·0 cites·20 claims
- 1354US12430794B2Online matching and optimization method combining geometry and texture, 3D scanning device, system and non-transitory storage mediumSHENZHEN JIMUYIDA TECH CO LTD·Filed 2023·Granted Sep 30, 2025·0 cites·18 claims
- 1454US12032020B2Calibration data generation circuit and associated methodREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Jul 9, 2024·0 cites·19 claims
- 1554US11451222B2Reliability detection device and reliability detection methodREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Sep 20, 2022·0 cites·20 claims
- 1654US9160322B2Clock edge detection device and methodREALTEK SEMICONDUCTOR CORP·Filed 2014·Granted Oct 13, 2015·1 cites·20 claims
- 1753US12044721B2Scan chain designing and circuit testing methodREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Jul 23, 2024·0 cites·20 claims
- 1853US11073555B2Circuit testing system and circuit testing methodREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Jul 27, 2021·0 cites·19 claims
- 1952US12211570B2Test circuit and method for reading data from a memory device during memory dumpREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Jan 28, 2025·0 cites·14 claims
- 2050US10234503B2Debugging method executed via scan chain for scan test and related circuitry systemREALTEK SEMICONDUCTOR CORP·Filed 2016·Granted Mar 19, 2019·0 cites·10 claims
- 2148US2021287086A1Wafer testing machine and method for training artificial intelligence model to test waferREALTEK SEMICONDUCTOR CORP·Filed 2021·Application pending·0 cites
- 2246US2009193064A1Method and system for access-rate-based storage management of continuously stored dataCHEN YING·Filed 2009·Application pending·0 cites
- 2346US2016002108A1Targeted Air Control for Carbon Containing Fly AshGRACE W R & CO·Filed 2014·Application pending·0 cites
- 2445US11163003B2Electronic device test database generating method and electronic device test database generating apparatusREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Nov 2, 2021·0 cites·17 claims
- 2544US9568553B2Method of integrated circuit scan clock domain allocation and machine readable media thereofREALTEK SEMICONDUCTOR CORP·Filed 2013·Granted Feb 14, 2017·0 cites·13 claims
- 2644US2020036474A1Resource mapping method and apparatus thereofHUAWEI TECH CO LTD·Filed 2019·Application pending·0 cites
- 2744US2015368478A1Corrosion inhibiting reagent and resin coated bead wireBEKAERT SA NV·Filed 2013·Application pending·0 cites
- 2843US10496505B2Integrated circuit test methodREALTEK SEMICONDUCTOR CORP·Filed 2017·Granted Dec 3, 2019·0 cites·10 claims
- 2942US11488683B2Device for detecting margin of circuit operating at certain speedREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Nov 1, 2022·0 cites·18 claims
- 3042US9274543B2Estimation apparatus and method for estimating clock skewCHEN YING-YEN·Filed 2012·Granted Mar 1, 2016·0 cites·14 claims
- 3142US2014129885A1Scan clock generator and related method thereofREALTEK SEMICONDUCTOR CORP·Filed 2013·Application pending·0 cites
- 3241US11664805B2Data mutex filter circuit and data mutex filtering methodBEIJING BOE OPTOELECTRONICS TECH CO LTD·Filed 2021·Granted May 30, 2023·0 cites·17 claims
- 3341US2018052506A1Voltage and frequency scaling apparatus, system on chip and voltage and frequency scaling methodREALTEK SEMICONDUCTOR CORP·Filed 2017·Application pending·0 cites
- 3438US2021132147A1Test pattern generating method, test pattern generating device and fault model generating methodREALTEK SEMICONDUCTOR CORP·Filed 2020·Application pending·0 cites
- 3534US2004091939A1Device and method for detection of multiple analytesFiled 2002·Application pending·0 cites
- 3631US2012326701A1Configurable Process Variation Monitoring Circuit of Die and Monitoring Method ThereofCHEN YING-YEN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →