Inventor · disambiguated record
Marek Uncovsky
Also filed as: UNCOVSKY MAREK · UNCOVSKÝ MAREK
8 granted patents·6 pending applications·50 citations·filing 2003–2025
83Inventor score
Top patents by PatentIndex Score
14 records- 0186US7009187B2Particle detector suitable for detecting ions and electronsFEI CO·Filed 2003·Granted Mar 7, 2006·28 cites·21 claims
- 0285US10978272B2Measurement and endpointing of sample thicknessFEI CO·Filed 2019·Granted Apr 13, 2021·5 cites·18 claims
- 0383US8735849B2Detector for use in charged-particle microscopyHLAVENKA PETR·Filed 2012·Granted May 27, 2014·9 cites·21 claims
- 0476US9153416B2Detection method for use in charged-particle microscopyFEI CO·Filed 2014·Granted Oct 6, 2015·2 cites·20 claims
- 0576US7791020B2Multistage gas cascade amplifierFEI CO·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 0660US12183539B2Inert gas sample transfer for beam systemsFEI CO·Filed 2022·Granted Dec 31, 2024·0 cites·20 claims
- 0759US9679741B2Environmental cell for charged particle beam systemNOVAK LIBOR·Filed 2010·Granted Jun 13, 2017·2 cites·40 claims
- 0856US11335536B2Light guide assembly for an electron microscopeFEI CO·Filed 2020·Granted May 17, 2022·0 cites·26 claims
- 0954US2025379024A1Lens arrangement in an electron microscopy systemFEI CO·Filed 2024·Application pending·0 cites
- 1053US2025191873A1Objective lenses, charged particle microscopes including the same, and associated methodsFEI CO·Filed 2023·Application pending·0 cites
- 1153US2025372341A1Method of virtual sectioning of stem sample using combination of seFEI CO·Filed 2023·Application pending·0 cites
- 1252US2025231130A1Improved scanning electron microscope and method of using the sameFEI CO·Filed 2025·Application pending·0 cites
- 1333US2018061613A1Charged-particle microscope with exchangeable pole piece extending elementFEI CO·Filed 2017·Application pending·0 cites
- 1432US2017103868A1Investigation of high-temperature specimens in a charged particle microscopeFEI CO·Filed 2016·Application pending·0 cites
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