Inventor · disambiguated record
Bradley Ries
Also filed as: RIES BRADLEY
8 granted patents·18 citations·filing 2014–2023
78Inventor score
Top patents by PatentIndex Score
8 records- 0193US9734568B2Automated inline inspection and metrology using shadow-gram imagesKLA TENCOR CORP·Filed 2015·Granted Aug 15, 2017·15 cites·15 claims
- 0264US10365639B2Feature selection and automated process window monitoring through outlier detectionKLA TENCOR CORP·Filed 2016·Granted Jul 30, 2019·1 cites·20 claims
- 0361US10949964B2Super-resolution defect review image generation through generative adversarial networksKLA TENCOR CORP·Filed 2018·Granted Mar 16, 2021·1 cites·12 claims
- 0461US10290088B2Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughputKLA TENCOR CORP·Filed 2014·Granted May 14, 2019·1 cites·19 claims
- 0559US12062165B2Characterization system and method with guided defect discoveryKLA CORP·Filed 2022·Granted Aug 13, 2024·0 cites·10 claims
- 0655US11922619B2Context-based defect inspectionKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·27 claims
- 0754US11256967B2Characterization system and method with guided defect discoveryKLA CORP·Filed 2020·Granted Feb 22, 2022·0 cites·21 claims
- 0843US9569834B2Automated image-based process monitoring and controlKLA TENCOR CORP·Filed 2015·Granted Feb 14, 2017·0 cites·12 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →