Inventor · disambiguated record
Jens Kuenzer
Also filed as: KUENZER JENS
11 granted patents·45 citations·filing 2003–2019
87Inventor score
Top patents by PatentIndex Score
11 records- 0193US10746790B1Constrained pseudorandom test pattern for in-system logic built-in self-testIBM·Filed 2019·Granted Aug 18, 2020·12 cites·20 claims
- 0286US9740813B1Layout effect characterization for integrated circuitsIBM·Filed 2016·Granted Aug 22, 2017·4 cites·15 claims
- 0379US10459031B2Electronic circuit having serial latch scan chainsGLOBALFOUNDRIES INC·Filed 2014·Granted Oct 29, 2019·5 cites·15 claims
- 0478US7602874B2Providing accurate time-based counters for scaling operating frequencies of microprocessorsIBM·Filed 2006·Granted Oct 13, 2009·8 cites·18 claims
- 0576US8363487B2Method, system, computer program product, and data processing device for monitoring memory circuits and corresponding integrated circuitIBM·Filed 2010·Granted Jan 29, 2013·6 cites·23 claims
- 0672US7996738B2Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chipIBM·Filed 2008·Granted Aug 9, 2011·7 cites·20 claims
- 0758US10114914B2Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Oct 30, 2018·0 cites·15 claims
- 0858US9904748B1Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Feb 27, 2018·0 cites·14 claims
- 0953US7646838B2Providing accurate time-based counters for scaling operating frequencies of microprocessorsIBM·Filed 2008·Granted Jan 12, 2010·0 cites·16 claims
- 1048US10768232B2ATE compatible high-efficient functional testIBM·Filed 2017·Granted Sep 8, 2020·0 cites·17 claims
- 1142US6989696B2System and method for synchronizing divide-by countersIBM·Filed 2003·Granted Jan 24, 2006·3 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →