Inventor · disambiguated record
Juntaro Arima
Also filed as: ARIMA JUNTARO
20 granted patents·2 pending applications·190 citations·filing 1985–2017
95Inventor score
Top patents by PatentIndex Score
22 records- 0192US6627888B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 30, 2003·30 cites·9 claims
- 0288US6708072B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 16, 2004·32 cites·22 claims
- 0387US7551976B2Industrial device receiving remote maintenance operation and outputting charge informationHITACHI LTD·Filed 2007·Granted Jun 23, 2009·12 cites·2 claims
- 0481US7373501B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2003·Granted May 13, 2008·18 cites·3 claims
- 0581US7047093B2Semiconductor manufacturing apparatus and its diagnosis apparatus and operating systemHITACHI HIGH TECH CORP·Filed 2003·Granted May 16, 2006·22 cites·27 claims
- 0677US7439505B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Oct 21, 2008·2 cites·7 claims
- 0777US4725730ASystem of automatically measuring sectional shapeHITACHI LTD·Filed 1985·Granted Feb 16, 1988·22 cites·4 claims
- 0876US6792325B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Sep 14, 2004·6 cites·9 claims
- 0974US6954677B2Remote maintenance method for industrial device that generates maintenance charge information using received charge listHITACHI LTD·Filed 2004·Granted Oct 11, 2005·4 cites·4 claims
- 1070US7849304B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 7, 2010·1 cites·66 claims
- 1165US7047096B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted May 16, 2006·6 cites·4 claims
- 1264US6862485B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 1, 2005·6 cites·8 claims
- 1363US6803573B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Oct 12, 2004·6 cites·6 claims
- 1462US6901306B2Semiconductor manufacturing apparatus and its diagnosis apparatus and operating systemHITACHI HIGH TECH CORP·Filed 2002·Granted May 31, 2005·7 cites·9 claims
- 1562US2008133032A1System and method for on-line diagnosticsARIMA JUNTARO·Filed 2007·Application pending·0 cites
- 1658US8666165B2Scanning electron microscopeYAMAGUCHI SATORU·Filed 2008·Granted Mar 4, 2014·1 cites·6 claims
- 1753US6925423B2Monitoring device and monitoring method for vacuum deviceHITACHI LTD·Filed 2002·Granted Aug 2, 2005·6 cites·9 claims
- 1852US7002151B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted Feb 21, 2006·2 cites·12 claims
- 1951US7177715B2Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted Feb 13, 2007·0 cites·4 claims
- 2050US4912328AApparatus for improving the signal-to-noise ratio of image signals in a scan-type imaging systemHITACHI LTD·Filed 1988·Granted Mar 27, 1990·7 cites·6 claims
- 2142US7117127B2Monitoring device and monitoring method for vacuum deviceHITACHI LTD·Filed 2005·Granted Oct 3, 2006·0 cites·12 claims
- 2240US2020035352A1Server, control system, control method and non-transitory computer readable mediumHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →