Inventor · disambiguated record
Hong-Ze Lin
Also filed as: Lin hong-ze
11 granted patents·1 pending application·20 citations·filing 2009–2017
84Inventor score
Top patents by PatentIndex Score
12 records- 0180US8786362B1Schottky diode having current leakage protection structure and current leakage protecting method of the sameUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 22, 2014·6 cites·15 claims
- 0274US8482063B2High voltage semiconductor deviceLIN AN-HUNG·Filed 2011·Granted Jul 9, 2013·5 cites·13 claims
- 0364US8643104B1Lateral diffusion metal oxide semiconductor transistor structureLIAO WEI-SHAN·Filed 2012·Granted Feb 4, 2014·3 cites·14 claims
- 0464US8581338B2Lateral-diffused metal oxide semiconductor device (LDMOS) and fabrication method thereofLIN AN-HUNG·Filed 2011·Granted Nov 12, 2013·2 cites·8 claims
- 0563US8450801B2Lateral-diffusion metal-oxide-semiconductor deviceLin hong-ze·Filed 2010·Granted May 28, 2013·3 cites·19 claims
- 0653US8587058B2Lateral diffused metal-oxide-semiconductor deviceLIN AN-HUNG·Filed 2012·Granted Nov 19, 2013·1 cites·11 claims
- 0752US9859377B2Isolation structure integrated with semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 2, 2018·0 cites·6 claims
- 0849US8803235B2Lateral-diffused metal oxide semiconductor device (LDMOS) and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Aug 12, 2014·0 cites·15 claims
- 0947US9502508B2Method for manufacturing isolation structure integrated with semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Nov 22, 2016·0 cites·13 claims
- 1041US2011079849A1Lateral-diffusion metal-oxide-semiconductor deviceYAN TING-ZHOU·Filed 2009·Application pending·0 cites
- 1130US10164089B1Power MOSFETUNITED MICROELECTRONICS CORP·Filed 2017·Granted Dec 25, 2018·0 cites·20 claims
- 1228US10134891B2Transistor device with threshold voltage adjusted by body effectUNITED MICROELECTRONICS CORP·Filed 2016·Granted Nov 20, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →