Inventor · disambiguated record
Mitsuharu Hirano
Also filed as: HIRANO MITSUHARU
8 granted patents·11 pending applications·27 citations·filing 2012–2022
82Inventor score
Top patents by PatentIndex Score
19 records- 0191US9645322B2Optical probe for optical coherence tomography and manufacturing method thereforSUMITOMO ELECTRIC INDUSTRIES·Filed 2016·Granted May 9, 2017·12 cites·7 claims
- 0284US10564370B2Optical connecting device, light processing apparatus, method for fabricating optical connecting deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Granted Feb 18, 2020·4 cites·4 claims
- 0381US10877228B2Optical coupling device and method for producing optical coupling deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Granted Dec 29, 2020·3 cites·9 claims
- 0480US10795099B2Optical connecting device, method for fabricating optical connecting deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Granted Oct 6, 2020·3 cites·16 claims
- 0574US10353159B2Optical connecting device, optical processing apparatus, method for fabricating optical connecting device, method for fabricating optical processing apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Granted Jul 16, 2019·2 cites·20 claims
- 0670US10332937B2Semiconductor device having a protruding interposer edge faceSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Granted Jun 25, 2019·1 cites·10 claims
- 0768US10371905B2Optical processing apparatus, optical connectorSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Granted Aug 6, 2019·1 cites·6 claims
- 0858US9128249B2Optical probe and optical measuring methodSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Granted Sep 8, 2015·1 cites·5 claims
- 0949US2023043715A1Probe, probe device, and inspection methodSUMITOMO ELECTRIC INDUSTRIES·Filed 2022·Application pending·0 cites
- 1045US2015248770A1Optical measurement method and optical measurement systemSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Application pending·0 cites
- 1145US2020049910A1Optical connecting deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2019·Application pending·0 cites
- 1244US2015173607A1Method for acquiring optical tomographic imageSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Application pending·0 cites
- 1343US2014212091A1Optical probeSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Application pending·0 cites
- 1442US2019070805A1Method for fabricating optical connecting deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Application pending·0 cites
- 1541US2015245768A1Optical probe, optical measurement method, and optical measurement deviceHASEGAWA TAKEMI·Filed 2012·Application pending·0 cites
- 1641US2015077748A1Spectroscopic imaging device adjusting method and spectroscopic imaging systemSUMITOMO ELECTRIC INDUSTRIES·Filed 2013·Application pending·0 cites
- 1740US2022196705A1Inspection apparatus and inspection method for electronic deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2021·Application pending·0 cites
- 1840US2018252876A1Optical apparatus, stub deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2018·Application pending·0 cites
- 1939US2018088282A1Optical connecting device, optical processing apparatus, method for fabricating optical processing apparatusSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →