Inventor · disambiguated record
Seiro Miyoshi
Also filed as: MIYOSHI SEIRO
15 granted patents·9 pending applications·521 citations·filing 1997–2016
91Inventor score
Top patents by PatentIndex Score
24 records- 0198US6025117AMethod of forming a pattern using polysilaneTOSHIBA KK·Filed 1997·Granted Feb 15, 2000·423 cites·4 claims
- 0286US7779777B2Substrate processing apparatus and methodTOSHIBA KK·Filed 2009·Granted Aug 24, 2010·9 cites·6 claims
- 0381US6576375B1PhotomaskTOSHIBA KK·Filed 2000·Granted Jun 10, 2003·24 cites·17 claims
- 0478US6270948B1Method of forming patternTOSHIBA KK·Filed 1999·Granted Aug 7, 2001·54 cites·12 claims
- 0575US8759177B2Pattern forming methodYANAI YOSHIHIRO·Filed 2012·Granted Jun 24, 2014·5 cites·20 claims
- 0671US8423926B2Acceptance determining method of blank for EUV mask and manufacturing method of EUV maskKOSHIBA TAKESHI·Filed 2011·Granted Apr 16, 2013·2 cites·16 claims
- 0769US9202763B2Defect pattern evaluation method, defect pattern evaluation apparatus, and recording mediaTOSHIBA KK·Filed 2013·Granted Dec 1, 2015·2 cites·20 claims
- 0864US8178366B2Pattern forming method, manufacturing method of semiconductor device, and template manufacturing methodMIYOSHI SEIRO·Filed 2011·Granted May 15, 2012·2 cites·10 claims
- 0959US9576100B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2014·Granted Feb 21, 2017·0 cites·13 claims
- 1053US8984454B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2013·Granted Mar 17, 2015·0 cites·16 claims
- 1150US7973907B2Method for treating substrate, method for conveying substrate, and apparatus for conveying substrateTOSHIBA KK·Filed 2008·Granted Jul 5, 2011·0 cites·17 claims
- 1250US2007266936A1Substrate processing apparatus and methodSHIOBARA EISHI·Filed 2007·Application pending·0 cites
- 1347US10176290B2Manufacturing method for a semiconductor device, pattern generating method and nontransitory computer readable medium storing a pattern generating programTOSHIBA MEMORY CORP·Filed 2016·Granted Jan 8, 2019·0 cites·9 claims
- 1447US7985685B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2008·Granted Jul 26, 2011·0 cites·20 claims
- 1545US9547743B2Manufacturing method for a semiconductor device, pattern generating method and nontransitory computer readable medium storing a pattern generating programTOSHIBA KK·Filed 2015·Granted Jan 17, 2017·0 cites·8 claims
- 1641US2009246954A1Method of manufacturing semiconductor deviceMIYOSHI SEIRO·Filed 2009·Application pending·0 cites
- 1740US9070559B2Pattern forming method and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2014·Granted Jun 30, 2015·0 cites·6 claims
- 1840US2015220846A1Process conversion difference prediction device, process conversion difference prediction method, and non-transitory computer-readable recording medium containing a process conversion difference prediction programTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1937US2009123878A1Patterning methodMIYOSHI SEIRO·Filed 2008·Application pending·0 cites
- 2037US2011012297A1Pattern transfer methodKOBIKI AYUMI·Filed 2010·Application pending·0 cites
- 2135US2004101787A1Fine pattern forming methodFiled 2002·Application pending·0 cites
- 2234US2010187714A1Pattern generation method, recording medium, and pattern formation methodKOBIKI AYUMI·Filed 2010·Application pending·0 cites
- 2330US2010304568A1Pattern forming methodMIYOSHI SEIRO·Filed 2010·Application pending·0 cites
- 2428US2011224934A1Evaluating apparatus, evaluating method, and computer program productMIYOSHI SEIRO·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →