Inventor · disambiguated record
Yasuhiro Gunji
Also filed as: GUNJI YASUHIRO
32 granted patents·12 pending applications·629 citations·filing 1986–2018
97Inventor score
Files withHITACHI LTD10HITACHI HIGH TECH CORP7NISSAN CHEMICAL IND LTD5OMINAMI YUSUKE3ZANAVY INFORMATICS KK3
Top patents by PatentIndex Score
44 records- 0192US6081230ANavigation system furnished with means for estimating error of mounted sensorZANAVY INFORMATICS KK·Filed 1994·Granted Jun 27, 2000·121 cites·9 claims
- 0291US8421010B2Charged particle beam device for scanning a sample using a charged particle beam to inspect the sampleHIROI TAKASHI·Filed 2009·Granted Apr 16, 2013·16 cites·10 claims
- 0391US6825480B1Charged particle beam apparatus and automatic astigmatism adjustment methodHITACHI LTD·Filed 2000·Granted Nov 30, 2004·38 cites·10 claims
- 0487US5926117AVehicle control system, vehicle mounting apparatus, base station apparatus and vehicle control methodHITACHI LTD·Filed 1998·Granted Jul 20, 1999·192 cites·2 claims
- 0584US7439504B2Pattern inspection method and apparatus using electron beamHITACHI LTD·Filed 2005·Granted Oct 21, 2008·6 cites·4 claims
- 0680US8565509B2Circuit pattern inspecting apparatus, management system including circuit pattern inspecting apparatus, and method for inspecting circuit patternTAKAHASHI HIROYUKI·Filed 2009·Granted Oct 22, 2013·6 cites·26 claims
- 0780US7271385B2Inspection method and inspection apparatus using electron beamHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 18, 2007·5 cites·5 claims
- 0880US6614022B2Pattern inspection method and apparatus using electron beamHITACHI LTD·Filed 2001·Granted Sep 2, 2003·11 cites·28 claims
- 0978US8168950B2Charged particle beam apparatus, and image generation method with charged particle beam apparatusFURUHASHI KANJI·Filed 2008·Granted May 1, 2012·10 cites·10 claims
- 1078US7518383B2Inspection apparatus and inspection method using electron beamHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 14, 2009·4 cites·4 claims
- 1177US7999565B2Inspection apparatus and inspection method using electron beamHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 16, 2011·3 cites·6 claims
- 1277US6175802B1Map displaying method and apparatus, and navigation system having the map displaying apparatusZANAVY INFORMATICS KK·Filed 1997·Granted Jan 16, 2001·52 cites·27 claims
- 1375US8207513B2Charged particle beam apparatusSASAKI YUKO·Filed 2009·Granted Jun 26, 2012·3 cites·8 claims
- 1475US6341254B1Map displaying method and apparatus, and navigation system having the map displaying apparatusXANAVI INFORMATICS CORPORATION·Filed 2000·Granted Jan 22, 2002·28 cites·1 claims
- 1573US7030394B2Charged particle beam apparatus and automatic astigmatism adjustment methodHITACHI LTD·Filed 2004·Granted Apr 18, 2006·8 cites·10 claims
- 1672US8086022B2Electron beam inspection system and an image generation method for an electron beam inspection systemMIYAI HIROSHI·Filed 2008·Granted Dec 27, 2011·4 cites·8 claims
- 1772US5208652AAn improved optical branching/coupling unit for an optical fiber gyroscope, and navigation system employing the sameHITACHI LTD·Filed 1991·Granted May 4, 1993·36 cites·26 claims
- 1871US6940069B2Pattern inspection method and apparatus using electron beamHITACHI LTD·Filed 2003·Granted Sep 6, 2005·6 cites·11 claims
- 1971US6714861B2Map displaying method and apparatus, and navigation system having the map displaying apparatusZANAVY INFORMATICS KK·Filed 2001·Granted Mar 30, 2004·20 cites·8 claims
- 2070US8086021B2Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscopeOMINAMI YUSUKE·Filed 2009·Granted Dec 27, 2011·2 cites·17 claims
- 2167US6903212B2Method for reducing an organic solvent remaining in β-form tris- (2,3,-epoxypropyl)—isocyanurate crystalsNISSAN CHEMICAL IND LTD·Filed 2001·Granted Jun 7, 2005·3 cites·37 claims
- 2265US7838828B2Semiconductor device inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 23, 2010·4 cites·5 claims
- 2365US6124454Aβ-form tris-(2, 3-epoxypropyl)-isocyanurate crystals and process for their productionNISSAN CHEMICAL IND LTD·Filed 1999·Granted Sep 26, 2000·10 cites·11 claims
- 2459US7348558B2Charged particle beam apparatus and automatic astigmatism adjustment methodHITACHI LTD·Filed 2006·Granted Mar 25, 2008·2 cites·13 claims
- 2559US6111104AMethod for reducing an organic solvent remaining in tris-(2,3-epoxypropyl)-isocyanurate crystalsNISSAN CHEMICAL IND LTD·Filed 1999·Granted Aug 29, 2000·7 cites·11 claims
- 2656US4836657AOptical change-over switch utilizing ferroelectric liquid crystal materialHITACHI LTD·Filed 1986·Granted Jun 6, 1989·18 cites·9 claims
- 2753US6486472B2Inspecting system using electron beam and inspecting method using sameHITACHI LTD·Filed 2001·Granted Nov 26, 2002·2 cites·10 claims
- 2853US6177541B1Process for producing an isocyanurate derivativeNISSAN CHEMICAL IND LTD·Filed 1999·Granted Jan 23, 2001·12 cites·7 claims
- 2953US2009206257A1Pattern inspection method and inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 3053US2006151698A1Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Application pending·0 cites
- 3152US2009309022A1Apparatus for inspecting a substrate, a method of inspecting a substrate, a scanning electron microscope, and a method of producing an image using a scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 3246US8242443B2Semiconductor device inspection apparatusOMINAMI YUSUKE·Filed 2010·Granted Aug 14, 2012·0 cites·4 claims
- 3345US6605718B2Method for reducing organic solvents remaining in tris-(2,3-epoxypropyl)-isocyanurate crystalsNISSAN CHEMICAL IND LTD·Filed 2001·Granted Aug 12, 2003·0 cites·23 claims
- 3444US2006060781A1Charged-particle beam apparatus and method for automatically correcting astigmatism and for height detectionWATANABE MASAHIRO·Filed 2005·Application pending·0 cites
- 3544US2004012506A1Information display system for displaying specified location with map therearound on display equipmentFiled 2003·Application pending·0 cites
- 3643US8900376B2Heat-resistant water-soluble flux composition for solderingGUNJI YASUHIRO·Filed 2005·Granted Dec 2, 2014·0 cites·9 claims
- 3742US9598528B2Modified epoxy resin compositionGUNJI YASUHIRO·Filed 2005·Granted Mar 21, 2017·0 cites·11 claims
- 3842US2005040331A1Inspection method and inspection apparatus using electron beamFiled 2004·Application pending·0 cites
- 3941US2020056029A1Composition for a sealing member, and sealing memberSANPO RUBBER IND CO LTD·Filed 2018·Application pending·0 cites
- 4040US2020040175A1Sealing memberKK RIKEN·Filed 2018·Application pending·0 cites
- 4140US2004026633A1Inspection method and inspection apparatus using electron beamFiled 2003·Application pending·0 cites
- 4239US2003201914A1Information display system for displaying specified location with map therearound on display equipmentFiled 2003·Application pending·0 cites
- 4338US2012091339A1Charged-particle microscope device, and method of controlling charged-particle beamsOMINAMI YUSUKE·Filed 2010·Application pending·0 cites
- 4437US2003006371A1Charged-particle beam apparatus and method for automatically correcting astigmatism of charged-particle beam apparatusFiled 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yasuhiro Gunji files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →