Inventor · disambiguated record
Shigeru Kitamura
Also filed as: KITAMURA SHIGERU
24 granted patents·5 pending applications·128 citations·filing 1997–2022
94Inventor score
Top patents by PatentIndex Score
29 records- 0179US5862280AFerrule for use with an optical fiber connector and method for production thereofYKK CORP·Filed 1997·Granted Jan 19, 1999·44 cites·26 claims
- 0277US11619644B2Analysis device and positioning methodARKRAY INC·Filed 2022·Granted Apr 4, 2023·0 cites·6 claims
- 0376US11388319B2Counter-rotating fan and image capturing deviceSONY CORP·Filed 2019·Granted Jul 12, 2022·2 cites·10 claims
- 0474US8128889B2Analyzing article, analyzer and method of analyzing a sample using the analyzing article, and a method of forming an opening in the analyzing articleFUJIMOTO KOJI·Filed 2003·Granted Mar 6, 2012·22 cites·7 claims
- 0573US9176049B2Method of optical analysis using reference cell and base plate correction and apparatus thereofFUJIMOTO KOJI·Filed 2008·Granted Nov 3, 2015·4 cites·12 claims
- 0672US6874379B2Pipet device with disposable tipARKRAY INC·Filed 2001·Granted Apr 5, 2005·16 cites·6 claims
- 0768US12405270B2Method for magnetically labeling particles and labeling apparatusARKRAY INC·Filed 2022·Granted Sep 2, 2025·0 cites·10 claims
- 0866US5989106AFerrule for use with an optical fiber connector and method for production thereofYKK CORP·Filed 1998·Granted Nov 23, 1999·25 cites·9 claims
- 0963US9101937B2Precise temperature controlling unit and method thereofKITAMURA SHIGERU·Filed 2010·Granted Aug 11, 2015·2 cites·13 claims
- 1060US11467175B2Analysis device and positioning methodARKRAY INC·Filed 2018·Granted Oct 11, 2022·0 cites·3 claims
- 1160US8303908B2Analyzing tool and deviceTAGUCHI TAKAYUKI·Filed 2003·Granted Nov 6, 2012·4 cites·10 claims
- 1260US7517692B2Temperature adjusting method for analytical tool and analytical device having temperature adjustment functionARKRAY INC·Filed 2003·Granted Apr 14, 2009·4 cites·19 claims
- 1357US11249077B2Method for magnetically labeling particles and labeling apparatusARKRAY INC·Filed 2017·Granted Feb 15, 2022·0 cites·13 claims
- 1457US8409522B2Analyzing instrument, temperature control method for liquid in analyzing instrument, and analyzing apparatusKITAMURA SHIGERU·Filed 2009·Granted Apr 2, 2013·0 cites·4 claims
- 1557US8398937B2Microchannel and analyzing deviceKITAMURA SHIGERU·Filed 2009·Granted Mar 19, 2013·2 cites·7 claims
- 1655US2011182775A1Analytical instrument and method for manufacturing sameARKRAY INC·Filed 2009·Application pending·0 cites
- 1753US7790008B2Electrophoresis chip and electrophoresis unit having the sameARKRAY INC·Filed 2005·Granted Sep 7, 2010·0 cites·8 claims
- 1852US8257570B2Electrophoresis chip and electrophoresis unit having the sameTAGUCHI TAKAYUKI·Filed 2010·Granted Sep 4, 2012·0 cites·4 claims
- 1952US8221606B2Electrophoresis chip and electrophoresis unit having the sameTAGUCHI TAKAYUKI·Filed 2010·Granted Jul 17, 2012·0 cites·7 claims
- 2051US9091665B2Terahertz spectrometry device and method, and nonlinear optical crystal inspection device and methodARKRAY INC·Filed 2013·Granted Jul 28, 2015·0 cites·11 claims
- 2150US7468162B2Analytical instrumentARKRAY INC·Filed 2003·Granted Dec 23, 2008·0 cites·7 claims
- 2250US2010282854A1Method for forming optical reading code and analytical toolARKRAY INC·Filed 2008·Application pending·0 cites
- 2349US2006073600A1Temperature control method for liquid components in analyzing instrument, the analyzing instrument and analyzing apparatusKITAMURA SHIGERU·Filed 2003·Application pending·0 cites
- 2446US7850909B2Analytical toolARKRAY INC·Filed 2003·Granted Dec 14, 2010·0 cites·20 claims
- 2546US7842343B2Method of producing analytical toolARKRAY INC·Filed 2003·Granted Nov 30, 2010·0 cites·15 claims
- 2643US2001019842A1Container for centrifugationFiled 2001·Application pending·0 cites
- 2742US8969805B2Terahertz wave measurement device and methodHASEBE TAKAYUKI·Filed 2013·Granted Mar 3, 2015·0 cites·10 claims
- 2841US7150858B2Centrifugal separatorARKRAY INC·Filed 2001·Granted Dec 19, 2006·3 cites·16 claims
- 2940US2012211659A1Terahertz Wave Characteristic Measurement Method, Material Detection Method, Measurement Instrument, Terahertz Wave Characteristic Measurement Device and Material Detection DeviceKITAMURA SHIGERU·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →