Inventor · disambiguated record
Shaun S. Gleason
Also filed as: GLEASON SHAUN · GLEASON SHAUN S
10 granted patents·454 citations·filing 1997–2017
90Inventor score
Files withUT BATTELLE LLC5GLEASON SHAUN S1JEFFERSON SCIENCE ASS LLC1LOCKHEED MARTIN ENERGY RES COR1MANN CHRISTOPHER J1
Top patents by PatentIndex Score
10 records- 0193US6370223B1Automatic detection of bone fragments in poultry using multi-energy x-raysUT BATTELLE LLC·Filed 2001·Granted Apr 9, 2002·94 cites·8 claims
- 0291US6456899B1Context-based automated defect classification system using multiple morphological masksUT BATTELLE LLC·Filed 1999·Granted Sep 24, 2002·158 cites·28 claims
- 0390US5982920AAutomated defect spatial signature analysis for semiconductor manufacturing processLOCKHEED MARTIN ENERGY RES COR·Filed 1997·Granted Nov 9, 1999·133 cites·25 claims
- 0478US8248614B2Quantitative phase-imaging systemsMANN CHRISTOPHER J·Filed 2009·Granted Aug 21, 2012·10 cites·23 claims
- 0569US8170302B1System and method for generating motion corrected tomographic imagesGLEASON SHAUN S·Filed 2005·Granted May 1, 2012·13 cites·13 claims
- 0663US7209579B1Anatomic and functional imaging of tagged molecules in animalsJEFFERSON SCIENCE ASS LLC·Filed 2003·Granted Apr 24, 2007·30 cites·5 claims
- 0757US6421409B1Ultra-high resolution computed tomography imagingUT BATTELLE LLC·Filed 2000·Granted Jul 16, 2002·12 cites·9 claims
- 0846US8988601B2Imaging system warp correction with phantom assemblySIEMENS MEDICAL SOLUTIONS·Filed 2012·Granted Mar 24, 2015·0 cites·21 claims
- 0946US7218772B2Method for non-referential defect characterization using fractal encoding and active contoursUT BATTELLE LLC·Filed 2002·Granted May 15, 2007·4 cites·12 claims
- 1040US10678937B2Resolution system that provides access to remote data locallyUT BATTELLE LLC·Filed 2017·Granted Jun 9, 2020·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Shaun S. Gleason files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →