Inventor · disambiguated record
Syuso Fujii
Also filed as: FUJII SYUSO
34 granted patents·772 citations·filing 1983–1998
98Inventor score
Top patents by PatentIndex Score
34 records- 0192US4569036ASemiconductor dynamic memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Feb 4, 1986·59 cites·8 claims
- 0288US5019729ATTL to CMOS buffer circuitTOSHIBA KK·Filed 1989·Granted May 28, 1991·39 cites·31 claims
- 0385US5119337ASemiconductor memory device having burn-in test functionTOSHIBA KK·Filed 1990·Granted Jun 2, 1992·60 cites·9 claims
- 0484US4994874AInput protection circuit for semiconductor integrated circuit deviceTOSHIBA KK·Filed 1989·Granted Feb 19, 1991·46 cites·10 claims
- 0580US5016224ASemiconductor memory deviceTOSHIBA KK·Filed 1989·Granted May 14, 1991·39 cites·14 claims
- 0676US5734619ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1992·Granted Mar 31, 1998·30 cites·17 claims
- 0775US5231607ASemiconductor memory deviceTOSHIBA KK·Filed 1990·Granted Jul 27, 1993·36 cites·15 claims
- 0875US5079613ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1990·Granted Jan 7, 1992·37 cites·35 claims
- 0974US4641165ADynamic memory device with an RC circuit for inhibiting the effects of alpha particle radiationTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Feb 3, 1987·21 cites·20 claims
- 1072US4941031ADynamic memory device with improved wiring layer layoutTOSHIBA KK·Filed 1989·Granted Jul 10, 1990·32 cites·20 claims
- 1172US4896055ASemiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristicsTOSHIBA KK·Filed 1988·Granted Jan 23, 1990·25 cites·26 claims
- 1269US5726475ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1994·Granted Mar 10, 1998·29 cites·10 claims
- 1368US5293055ASemiconductor integrated circuit deviceTOSHIBA KK·Filed 1992·Granted Mar 8, 1994·28 cites·19 claims
- 1467US5233558ASemiconductor memory device capable of directly reading the potential of bit linesTOSHIBA KK·Filed 1991·Granted Aug 3, 1993·27 cites·22 claims
- 1567US4769792ASemiconductor memory device with voltage bootstrapTOSHIBA KK·Filed 1986·Granted Sep 6, 1988·22 cites·18 claims
- 1666US5066997ASemiconductor deviceTOSHIBA KK·Filed 1989·Granted Nov 19, 1991·32 cites·23 claims
- 1763US5374838ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Dec 20, 1994·19 cites·4 claims
- 1863US5142492ASemiconductor memory deviceTOSHIBA KK·Filed 1990·Granted Aug 25, 1992·19 cites·15 claims
- 1959US5970006ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1998·Granted Oct 19, 1999·14 cites·10 claims
- 2059US5594265AInput protection circuit formed in a semiconductor substrateTOSHIBA KK·Filed 1991·Granted Jan 14, 1997·17 cites·13 claims
- 2159US5260226ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Nov 9, 1993·16 cites·5 claims
- 2259US5238860ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Aug 24, 1993·19 cites·8 claims
- 2358US5420816ASemiconductor memory apparatus with configured word lines to reduce noiseTOSHIBA KK·Filed 1994·Granted May 30, 1995·18 cites·14 claims
- 2456US4748597ASemiconductor memory device with redundancy circuitsTOSHIBA KK·Filed 1986·Granted May 31, 1988·15 cites·6 claims
- 2554US5194762AMos-type charging circuitTOSHIBA KK·Filed 1990·Granted Mar 16, 1993·16 cites·19 claims
- 2649US5949109ASemiconductor device having input protection circuitTOSHIBA KK·Filed 1997·Granted Sep 7, 1999·10 cites·22 claims
- 2748US4931992ASemiconductor memory having barrier transistors connected between sense and restore circuitsTOSHIBA KK·Filed 1989·Granted Jun 5, 1990·10 cites·11 claims
- 2845US5150188AReference voltage generating circuit deviceTOSHIBA KK·Filed 1990·Granted Sep 22, 1992·10 cites·17 claims
- 2944US5862090ASemiconductor memory device having cell array divided into a plurality of cell blocksTOSHIBA KK·Filed 1997·Granted Jan 19, 1999·7 cites·17 claims
- 3037US5075752ABi-cmos semiconductor device having memory cells formed in isolated wellsTOSHIBA KK·Filed 1990·Granted Dec 24, 1991·5 cites·23 claims
- 3137US5016071ADynamic memory deviceTOSHIBA KK·Filed 1989·Granted May 14, 1991·5 cites·12 claims
- 3236US5041893ASemiconductor integrated circuit including an intrinsic MOS transistor for generating a reference voltageKANUSHIKI KAISHA TOSHIBA·Filed 1990·Granted Aug 20, 1991·6 cites·17 claims
- 3333US6104233ASubstrate structure of semi-conductor deviceTOSHIBA KK·Filed 1994·Granted Aug 15, 2000·3 cites·23 claims
- 3431USRE36236ESemiconductor memory deviceTOSHIBA KK·Filed 1995·Granted Jun 29, 1999·1 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →