Inventor · disambiguated record
Dieter Winkler
Also filed as: WINKLER DIETER
79 granted patents·13 pending applications·1,428 citations·filing 1987–2025
99Inventor score
Files withINTEGRATED CIRCUIT TESTING15ALSTOM TECHNOLOGY LTD13ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH13APPLIED MATERIALS INC11WINKLER DIETER6
Top patents by PatentIndex Score
92 records- 0198US10861666B1Method of operating a charged particle gun, charged particle gun, and charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2020·Granted Dec 8, 2020·5 cites·8 claims
- 0298US9035249B1Multi-beam system for high throughput EBIINTEGRATED CIRCUIT TESTING·Filed 2014·Granted May 19, 2015·83 cites·20 claims
- 0398US7274018B2Charged particle beam apparatus and method for operating the sameINTEGRATED CIRCUIT TESTING·Filed 2006·Granted Sep 25, 2007·162 cites·10 claims
- 0498US7045781B2Charged particle beam apparatus and method for operating the sameINTEGRATED CIRCUIT TESTING·Filed 2004·Granted May 16, 2006·214 cites·19 claims
- 0597US10483080B1Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Nov 19, 2019·22 cites·21 claims
- 0697US7363764B2Gas turbine power plant and method of operating the sameALSTOM TECHNOLOGY LTD·Filed 2005·Granted Apr 29, 2008·116 cites·20 claims
- 0797US6943349B2Multi beam charged particle deviceINTEGRATED CIRCUIT TESTING·Filed 2001·Granted Sep 13, 2005·126 cites·28 claims
- 0895US9620329B1Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Apr 11, 2017·14 cites·20 claims
- 0995US7692165B2Charged particle beam device with a gas field ion source and a gas supply systemINTEGRATED CIRCUIT TESTING·Filed 2007·Granted Apr 6, 2010·25 cites·20 claims
- 1095US7503178B2Thermal power plant with sequential combustion and reduced-CO2 emission, and a method for operating a plant of this typeALSTOM TECHNOLOGY LTD·Filed 2006·Granted Mar 17, 2009·146 cites·25 claims
- 1190US11495433B1Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimenICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 8, 2022·3 cites·18 claims
- 1290US6730907B1Charged particle deviceINTEGRATED CIRCUIT TESTING·Filed 2000·Granted May 4, 2004·33 cites·19 claims
- 1390US6331109B1Premix burnerALSTOM SWITZERLAND LTD·Filed 2000·Granted Dec 18, 2001·56 cites·44 claims
- 1488US8723117B2Switchable multi perspective detector, optics therefor and method of operating thereofLANIO STEFAN·Filed 2012·Granted May 13, 2014·9 cites·17 claims
- 1588US7345287B2Cooling module for charged particle beam column elementsAPPLIED MATERIALS INC·Filed 2005·Granted Mar 18, 2008·11 cites·21 claims
- 1685US2025308835A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1785US2025308836A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1884US6943507B2Device and method for controlling focussed electron beamsINTEGRATED CIRCUIT TESTING·Filed 2002·Granted Sep 13, 2005·19 cites·36 claims
- 1984US6555815B2Apparatus and method for examining specimen with a charged particle beamAPPLIED MATERIALS INC·Filed 1999·Granted Apr 29, 2003·41 cites·63 claims
- 2083US7589328B2Gas field ION source for multiple applicationsINTEGRATED CIRCUIT TESTING·Filed 2007·Granted Sep 15, 2009·6 cites·30 claims
- 2183US7427765B2Electron beam column for writing shaped electron beamsJEOL LTD·Filed 2005·Granted Sep 23, 2008·6 cites·18 claims
- 2282US9754759B2Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Sep 5, 2017·3 cites·19 claims
- 2381US7610761B2Method and device for the combustion of hydrogen in a premix burnerALSTOM TECHNOLOGY LTD·Filed 2007·Granted Nov 3, 2009·17 cites·22 claims
- 2481US7013648B2Premix burnerALSTOM TECHNOLOGY LTD·Filed 2004·Granted Mar 21, 2006·24 cites·27 claims
- 2580US10978270B2Charged particle beam device, interchangeable multi-aperture arrangement for a charged particle beam device, and method for operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Apr 13, 2021·2 cites·16 claims
- 2680US8101922B2Modular gas ion sourceWINKLER DIETER·Filed 2008·Granted Jan 24, 2012·7 cites·19 claims
- 2779US7800075B2Multi-function module for an electron beam columnBULLER BENYAMIN·Filed 2008·Granted Sep 21, 2010·4 cites·12 claims
- 2876US8793972B2Gas turbine installation with flue gas recirculation dependent on oxygen content of a gas flowBRAUTSCH ANDREAS·Filed 2009·Granted Aug 5, 2014·4 cites·14 claims
- 2976US8044370B2Gas ion source with high mechanical stabilityINTEGRATED CIRCUIT TESTING·Filed 2008·Granted Oct 25, 2011·6 cites·15 claims
- 3075US8963083B2Switchable multi perspective detector, optics therefore and method of operating thereofFIRNKES MATTHIAS·Filed 2013·Granted Feb 24, 2015·4 cites·20 claims
- 3174US7227155B2Electrostatic deflection system with impedance matching for high positioning accuracyAPPLIED MATERIALS INC·Filed 2005·Granted Jun 5, 2007·3 cites·20 claims
- 3272US11232924B2Method of operating a charged particle gun, charged particle gun, and charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2020·Granted Jan 25, 2022·0 cites·16 claims
- 3372US11183361B1Charged particle beam device and method for inspecting and/or imaging a sampleICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2020·Granted Nov 23, 2021·1 cites·19 claims
- 3470US7514682B2Electron anti-fogging baffle used as a detectorAPPLIED MATERIALS INC·Filed 2006·Granted Apr 7, 2009·2 cites·20 claims
- 3569US8158939B2High resolution gas field ion columnFROSIEN JUERGEN·Filed 2010·Granted Apr 17, 2012·2 cites·25 claims
- 3669US8143589B2Stable emission gas ion source and method for operation thereofWINKLER DIETER·Filed 2009·Granted Mar 27, 2012·2 cites·23 claims
- 3768US7638777B2Imaging system with multi source arrayINTEGRATED CIRCUIT TESTING·Filed 2004·Granted Dec 29, 2009·8 cites·22 claims
- 3868US6576908B1Beam column for charged particle beam deviceAPPLIED MATERIALS INC·Filed 1999·Granted Jun 10, 2003·20 cites·20 claims
- 3967US8330130B2Charged particle source with automated tip formationWINKLER DIETER·Filed 2008·Granted Dec 11, 2012·2 cites·22 claims
- 4066US12362131B2Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 15, 2025·0 cites·26 claims
- 4165US6499300B2Method for operating a power plantALSTOM SWITZERLAND LTD·Filed 2001·Granted Dec 31, 2002·7 cites·14 claims
- 4264US6497098B2Method and device for generating hot combustion waste gasesALSTOM SWITZERLAND LTD·Filed 2001·Granted Dec 24, 2002·11 cites·21 claims
- 4362US7282711B2Multiple electron beam deviceINTEGRATED CIRCUIT TESTING·Filed 2002·Granted Oct 16, 2007·6 cites·35 claims
- 4462US4956057AProcess for complete removal of nitrites and nitrates from an aqueous solutionASEA BROWN BOVERI·Filed 1989·Granted Sep 11, 1990·23 cites·3 claims
- 4561US7268361B2Electron emission deviceINTEGRATED CIRCUIT TESTING·Filed 2002·Granted Sep 11, 2007·4 cites·30 claims
- 4660US6982065B2CatalyzerALSTOM TECHNOLOGY LTD·Filed 2001·Granted Jan 3, 2006·4 cites·30 claims
- 4760US5791894APremix burnerABB RESEARCH LTD·Filed 1996·Granted Aug 11, 1998·20 cites·13 claims
- 4859US5107124AApparatus for modulating a particle beam intensitySIEMENS AG·Filed 1989·Granted Apr 21, 1992·9 cites·16 claims
- 4957US8122719B2Apparatus for the combustion of a fuel-oxidizer mixGRIFFIN TIMOTHY·Filed 2008·Granted Feb 28, 2012·0 cites·11 claims
- 5057US8026492B2Dual mode gas field ion sourceINTEGRATED CIRCUIT TESTING·Filed 2008·Granted Sep 27, 2011·0 cites·24 claims
Showing the top 50 of 92 patent records by PatentIndex Score.
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