Inventor · disambiguated record
Jeffrey Blackwood
Also filed as: BLACKWOOD JEFFREY · BLACKWOOD JEFFREY E
24 granted patents·2 pending applications·229 citations·filing 2002–2019
95Inventor score
Top patents by PatentIndex Score
26 records- 0196US7023225B2Wafer-mounted micro-probing platformLSI LOGIC CORP·Filed 2003·Granted Apr 4, 2006·115 cites·20 claims
- 0294US8912490B2Method for preparing samples for imagingFEI CO·Filed 2013·Granted Dec 16, 2014·20 cites·9 claims
- 0393US9601313B2Automated TEM sample preparationFEI CO·Filed 2015·Granted Mar 21, 2017·14 cites·20 claims
- 0492US8822921B2Method for preparing samples for imagingFEI CO·Filed 2013·Granted Sep 2, 2014·11 cites·15 claims
- 0589US9412560B2Bulk deposition for tilted mill protectionFEI CO·Filed 2013·Granted Aug 9, 2016·7 cites·20 claims
- 0689US8859998B2TEM sample preparationBLACKWOOD JEFFREY·Filed 2012·Granted Oct 14, 2014·15 cites·14 claims
- 0788US9111720B2Method for preparing samples for imagingFEI CO·Filed 2014·Granted Aug 18, 2015·7 cites·12 claims
- 0887US9741536B2High aspect ratio structure analysisFEI CO·Filed 2013·Granted Aug 22, 2017·7 cites·25 claims
- 0983US9279752B2Method for preparing thin samples for TEM imagingFEI CO·Filed 2014·Granted Mar 8, 2016·4 cites·15 claims
- 1083US9006651B2Method for creating S/TEM sample and sample structureFEI CO·Filed 2013·Granted Apr 14, 2015·2 cites·14 claims
- 1181US10340119B2Automated TEM sample preparationFEI CO·Filed 2017·Granted Jul 2, 2019·2 cites·24 claims
- 1279US9488554B2Method and system for reducing curtaining in charged particle beam sample preparationFEI CO·Filed 2013·Granted Nov 8, 2016·4 cites·19 claims
- 1379US9177760B2TEM sample preparationFEI CO·Filed 2014·Granted Nov 3, 2015·3 cites·13 claims
- 1478US10026590B2Fiducial design for tilted or glancing mill operations with a charged particle beamFEI CO·Filed 2013·Granted Jul 17, 2018·3 cites·8 claims
- 1576US10546719B2Face-on, gas-assisted etching for plan-view lamellae preparationFEI CO·Filed 2018·Granted Jan 28, 2020·2 cites·19 claims
- 1675US10825651B2Automated TEM sample preparationFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·20 claims
- 1769US7245758B2Whole-wafer photoemission analysisLSI CORP·Filed 2003·Granted Jul 17, 2007·9 cites·10 claims
- 1866US9336985B2Method for creating S/TEM sample and sample structureFEI CO·Filed 2015·Granted May 10, 2016·0 cites·16 claims
- 1963US9696372B2Multidimensional structural accessFEI CO·Filed 2013·Granted Jul 4, 2017·1 cites·21 claims
- 2059US11062879B2Face-on, gas-assisted etching for plan-view lamellae preparationFEI CO·Filed 2019·Granted Jul 13, 2021·0 cites·20 claims
- 2158US11315756B2Fiducial design for tilted or glancing mill operations with a charged particle beamFEI CO·Filed 2018·Granted Apr 26, 2022·0 cites·10 claims
- 2255US9378925B2TEM sample preparationFEI CO·Filed 2015·Granted Jun 28, 2016·0 cites·15 claims
- 2350US6817004B2Net segment analyzer for chip CAD layoutLSI LOGIC CORP·Filed 2003·Granted Nov 9, 2004·2 cites·26 claims
- 2449US9384982B2Depositing material into high aspect ratio structuresFEI CO·Filed 2013·Granted Jul 5, 2016·0 cites·19 claims
- 2542US2015330877A1Method for preparing samples for imagingFEI CO·Filed 2013·Application pending·0 cites
- 2632US2004032271A1Anisotropic probing contactorFiled 2002·Application pending·0 cites
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