Inventor · disambiguated record
Kaoru Shibata
Also filed as: SHIBATA KAORU
17 granted patents·7 pending applications·132 citations·filing 1977–2020
91Inventor score
Files withSUMITOMO ELECTRIC INDUSTRIES12HONDA MOTOR CO LTD6HONSHU PAPER CO LTD1KOUSOKUYA INC1KUBOI COATING WORKS CO LTD1
Top patents by PatentIndex Score
24 records- 0191US9123843B2Semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Sep 1, 2015·8 cites·10 claims
- 0291US7110859B2Setting method and setting apparatus for operation path for articulated robotHONDA MOTOR CO LTD·Filed 2001·Granted Sep 19, 2006·57 cites·19 claims
- 0384US9773932B2Epitaxial wafer and method for manufacturing sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Sep 26, 2017·6 cites·11 claims
- 0477US4117193AAntistatic, low temperature heat sealable polypropylene composite film and process for production thereofHONSHU PAPER CO LTD·Filed 1977·Granted Sep 26, 1978·48 cites·27 claims
- 0569US7640809B2Spot welding inspecting apparatusHONDA MOTOR CO LTD·Filed 2008·Granted Jan 5, 2010·3 cites·4 claims
- 0665US9680040B2Semiconductor device and method for manufacturing the sameSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Jun 13, 2017·1 cites·14 claims
- 0764US9887310B2Semiconductor layered structure, method for producing semiconductor layered structure, and method for producing semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Granted Feb 6, 2018·1 cites·10 claims
- 0859US8302479B2Method of evaluation using ultrasonic wavesSHIBATA KAORU·Filed 2009·Granted Nov 6, 2012·2 cites·9 claims
- 0956US6858288B2Wrap filmOJI PAPER CO·Filed 2001·Granted Feb 22, 2005·5 cites·27 claims
- 1049US9698287B2Epitaxial wafer, method for producing the same, semiconductor element, and optical sensor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Jul 4, 2017·0 cites·11 claims
- 1147US9171978B2Epitaxial wafer, method for producing the same, photodiode, and optical sensor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Granted Oct 27, 2015·0 cites·8 claims
- 1247US9156626B2Work method and work deviceHONDA MOTOR CO LTD·Filed 2013·Granted Oct 13, 2015·1 cites·4 claims
- 1347US2011236175A1Processing method and fabrication method of semiconductor deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2008·Application pending·0 cites
- 1446US12054641B2Antibacterial-coated product, antibacterial coating material, method for manufacturing antibacterial coating material, and method for manufacturing antibacterial-coated productKUBOI COATING WORKS CO LTD·Filed 2020·Granted Aug 6, 2024·0 cites·4 claims
- 1546US2010013058A1Semiconductor Wafer and Semiconductor Wafer Inspection MethodSUMITOMO ELECTRIC INDUSTRIES·Filed 2008·Application pending·0 cites
- 1642US8560573B2Map difference data generation apparatus and map difference data generation methodWATANABE TAKAYUKI·Filed 2012·Granted Oct 15, 2013·0 cites·11 claims
- 1740US10024516B2Optical moduleSUMITOMO ELECTRIC INDUSTRIES·Filed 2017·Granted Jul 17, 2018·0 cites·11 claims
- 1840US2017040477A1Semiconductor layered structure and photodiodeSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
- 1939US2016380137A1Light-receiving deviceSUMITOMO ELECTRIC INDUSTRIES·Filed 2014·Application pending·0 cites
- 2039US2011233174A1Spot welding methodHONDA MOTOR CO LTD·Filed 2011·Application pending·0 cites
- 2138US10547324B2Data compression coding method, apparatus therefor, and program thereforKOUSOKUYA INC·Filed 2018·Granted Jan 28, 2020·0 cites·9 claims
- 2237US12091252B2Parts storage position determination apparatus, parts storage position determination method and parts management systemHONDA MOTOR CO LTD·Filed 2020·Granted Sep 17, 2024·0 cites·6 claims
- 2337US2011266416A1Imaging apparatus, imaging method, and imaging programHONDA MOTOR CO LTD·Filed 2011·Application pending·0 cites
- 2434US2017294547A1Semiconductor layered structure, photodiode and sensorSUMITOMO ELECTRIC INDUSTRIES·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kaoru Shibata files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →