Inventor · disambiguated record
Anthony Graupera
Also filed as: GRAUPERA ANTHONY
17 granted patents·1 pending application·99 citations·filing 2008–2015
92Inventor score
Top patents by PatentIndex Score
18 records- 0194US8253118B2Charged particle beam system having multiple user-selectable operating modesZHANG SHOUYIN·Filed 2009·Granted Aug 28, 2012·32 cites·22 claims
- 0291US8822913B2Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ionsGRAUPERA ANTHONY·Filed 2011·Granted Sep 2, 2014·14 cites·24 claims
- 0388US8445870B2Charged particle beam system having multiple user-selectable operating modesZHANG SHOUYIN·Filed 2011·Granted May 21, 2013·14 cites·14 claims
- 0485US8642974B2Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolationKELLOGG SEAN·Filed 2011·Granted Feb 4, 2014·7 cites·20 claims
- 0585US8633452B2Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion sourceGRAUPERA ANTHONY·Filed 2011·Granted Jan 21, 2014·6 cites·19 claims
- 0683US9159534B2Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion sourceFEI CO·Filed 2014·Granted Oct 13, 2015·4 cites·20 claims
- 0781US8124942B2Plasma igniter for an inductively coupled plasma ion sourceGRAUPERA ANTHONY·Filed 2010·Granted Feb 28, 2012·9 cites·21 claims
- 0880US9087671B2Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ionsFEI CO·Filed 2014·Granted Jul 21, 2015·3 cites·24 claims
- 0971US8278220B2Method to direct pattern metals on a substrateHOLTERMANN THERESA·Filed 2008·Granted Oct 2, 2012·7 cites·20 claims
- 1070US8723143B2Plasma igniter for an inductively coupled plasma ion sourceGRAUPERA ANTHONY·Filed 2011·Granted May 13, 2014·2 cites·18 claims
- 1158US8987678B2Encapsulation of electrodes in solid mediaKELLOGG SEAN·Filed 2012·Granted Mar 24, 2015·1 cites·25 claims
- 1255US9627169B2Plasma ion source for use with a focused ion beam column with selectable ionsFEI CO·Filed 2015·Granted Apr 18, 2017·0 cites·19 claims
- 1355US9105438B2Imaging and processing for plasma ion sourceFEI CO·Filed 2013·Granted Aug 11, 2015·0 cites·20 claims
- 1453US9053895B2System for attachment of an electrode into a plasma sourceKELLOGG SEAN·Filed 2011·Granted Jun 9, 2015·0 cites·22 claims
- 1552US9691583B2Imaging and processing for plasma ion sourceFEI CO·Filed 2015·Granted Jun 27, 2017·0 cites·18 claims
- 1652US9530625B2Method for attachment of an electrode into an inductively-coupled plasmaFEI CO·Filed 2015·Granted Dec 27, 2016·0 cites·16 claims
- 1748US8759764B2On-axis detector for charged particle beam systemGRAUPERA ANTHONY·Filed 2012·Granted Jun 24, 2014·0 cites·19 claims
- 1840US2013250293A1Method and Apparatus for Actively Monitoring an Inductively-Coupled Plasma Ion Source using an Optical SpectrometerUTLAUT MARK W·Filed 2012·Application pending·0 cites
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